Export methods in fault detection and localization mechanisms

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作者：
Université de Rennes 1-IRISA, Campus de Beaulieu, 35042 Rennes Cedex, France [1 ]
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Int. J. Comput. Sci. Issues | / 4 4-2卷 / 463-471期
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Compendex;
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摘要：
Fault detection
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