Growth conditions, structure, Raman characterization and optical properties of Sm-doped (LuxGd1-x)2SiO5 single crystals grown by the Czochralski method

被引：22
|
作者：
机构：
[1] Glowacki, Michal
[2] Dominiak-Dzik, Grayna
[3] Ryba-Romanowski, Witold
[4] Lisiecki, RadosLaw
[5] Strzp, Adam
[6] Runka, Tomasz
[7] Drozdowski, MirosLaw
[8] Domukhovski, Viktor
[9] 1,Diduszko, Ryszard
[10] Berkowski, Marek
来源：
Głowacki, M. (glowacki@ifpan.edu.pl) | 1600年 / Academic Press Inc.卷 / 186期
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D O I：
10.1016/j.jssc.2011.12.021
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