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- [42] Influence of solder cap thickness on the interfacial reaction in Cu/Sn/Ni copper pillar bump 2017 18TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT), 2017, : 639 - 643
- [44] Electrical characteristics for Sn-Ag-Cu solder bump with Ti/Ni/Cu under-bump metallization after temperature cycling tests Journal of Electronic Materials, 2006, 35 : 1773 - 1780
- [45] The Effect of the SnAg Solder Joint Morphology on the Thermal Cycle Reliability of 40 μm Fine-pitch Cu-pillar/SnAg Micro Bump Interconnection 2018 IEEE 68TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC 2018), 2018, : 649 - 654
- [46] Highly thermostable joint of a Cu/Ni–P plating/Sn–0.7Cu solder added with Cu balls Journal of Materials Science, 2017, 52 : 3244 - 3254
- [47] The microstructure of Cu joint soldered with a new Cu coated Ni foam reinforced Sn composite solder 2023 24TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY, ICEPT, 2023,
- [48] Effect of Ni surface finish on half etched Cu on solder joint reliability 57TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, 2007 PROCEEDINGS, 2007, : 415 - +
- [49] Influences of Ni addition into Cu–xNi alloy on the microstructure evolution and mechanical property of Sn–58Bi/Cu–xNi solder joint Applied Physics A, 2020, 126