Temperature dependent high-bias electrical properties of C60 microrods
被引:0
作者:
Goyal, Anubha
论文数: 0引用数: 0
h-index: 0
机构:
Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, United StatesDepartment of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, United States
Goyal, Anubha
[1
]
Kumar, Ashavani
论文数: 0引用数: 0
h-index: 0
机构:
Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, United StatesDepartment of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, United States
Kumar, Ashavani
[1
]
Kar, Swastik
论文数: 0引用数: 0
h-index: 0
机构:
Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, United StatesDepartment of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, United States
Kar, Swastik
[1
]
Ajayan, Pulickel M.
论文数: 0引用数: 0
h-index: 0
机构:
Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, United StatesDepartment of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, United States
Ajayan, Pulickel M.
[1
]
Soldano, Caterina
论文数: 0引用数: 0
h-index: 0
机构:
Department of Physics, Applied Physics and Astronomy, Rensselaer Polytechnic Institute, Troy, NY 12180, United StatesDepartment of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, United States
Soldano, Caterina
[2
]
机构:
[1] Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, United States
[2] Department of Physics, Applied Physics and Astronomy, Rensselaer Polytechnic Institute, Troy, NY 12180, United States