Temperature dependent high-bias electrical properties of C60 microrods

被引:0
作者
Goyal, Anubha [1 ]
Kumar, Ashavani [1 ]
Kar, Swastik [1 ]
Ajayan, Pulickel M. [1 ]
Soldano, Caterina [2 ]
机构
[1] Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, United States
[2] Department of Physics, Applied Physics and Astronomy, Rensselaer Polytechnic Institute, Troy, NY 12180, United States
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Journal of Applied Physics | 2008年 / 103卷 / 06期
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