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- [22] Thin Film Thickness Measurement of Whole Field Based on Spatial Carrier Frequency Interferometry FOURTH INTERNATIONAL CONFERENCE ON EXPERIMENTAL MECHANICS, 2010, 7522
- [23] An image-processing based method for the measurement of the film thickness of a swirl atomizer Journal of Visualization, 2017, 20 : 1 - 5
- [24] Study on Thin Film Thickness Measurement Method Based on Digital Image Processing 5TH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES: OPTICAL TEST AND MEASUREMENT TECHNOLOGY AND EQUIPMENT, 2010, 7656
- [26] Thin-Film Thickness Measurement Method Based on the Reflection Interference Spectrum 6TH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES: LARGE MIRRORS AND TELESCOPES, 2012, 8415