共 17 条
[1]
A device simulation and model verification of single event transients in n+-p junctions
[J].
Abadir, GB
;
Fikry, W
;
Ragai, HF
;
Omar, OA
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
2005, 52 (05)
:1518-1523

Abadir, GB
论文数: 0 引用数: 0
h-index: 0
机构:
Ain Shams Univ, Fac Engn, Cairo, Egypt Ain Shams Univ, Fac Engn, Cairo, Egypt

Fikry, W
论文数: 0 引用数: 0
h-index: 0
机构:
Ain Shams Univ, Fac Engn, Cairo, Egypt Ain Shams Univ, Fac Engn, Cairo, Egypt

Ragai, HF
论文数: 0 引用数: 0
h-index: 0
机构:
Ain Shams Univ, Fac Engn, Cairo, Egypt Ain Shams Univ, Fac Engn, Cairo, Egypt

Omar, OA
论文数: 0 引用数: 0
h-index: 0
机构:
Ain Shams Univ, Fac Engn, Cairo, Egypt Ain Shams Univ, Fac Engn, Cairo, Egypt
[2]
Pulsed-Laser Testing for Single-Event Effects Investigations
[J].
Buchner, Stephen P.
;
Miller, Florent
;
Pouget, Vincent
;
McMorrow, Dale P.
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
2013, 60 (03)
:1852-1875

Buchner, Stephen P.
论文数: 0 引用数: 0
h-index: 0
机构:
Naval Res Lab, Washington, DC 20375 USA Naval Res Lab, Washington, DC 20375 USA

Miller, Florent
论文数: 0 引用数: 0
h-index: 0
机构:
EADS, Suresnes, France Naval Res Lab, Washington, DC 20375 USA

Pouget, Vincent
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Bordeaux, IMS, Bordeaux, France Naval Res Lab, Washington, DC 20375 USA

McMorrow, Dale P.
论文数: 0 引用数: 0
h-index: 0
机构:
Naval Res Lab, Washington, DC 20375 USA Naval Res Lab, Washington, DC 20375 USA
[3]
Comparison of Single Event Transients Generated by Short Pulsed X-Rays, Lasers and Heavy Ions
[J].
Cardoza, David
;
LaLumondiere, Stephen D.
;
Tockstein, Michael A.
;
Brewe, Dale L.
;
Wells, Nathan P.
;
Koga, Rokutaro
;
Gaab, Kevin M.
;
Lotshaw, William T.
;
Moss, Steven C.
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
2014, 61 (06)
:3154-3162

Cardoza, David
论文数: 0 引用数: 0
h-index: 0
机构:
Aerosp Corp, Phys Sci Labs, Elect & Photon Lab, Photon Technol Dept, Los Angeles, CA 90009 USA Aerosp Corp, Phys Sci Labs, Elect & Photon Lab, Photon Technol Dept, Los Angeles, CA 90009 USA

LaLumondiere, Stephen D.
论文数: 0 引用数: 0
h-index: 0
机构:
Aerosp Corp, Phys Sci Labs, Elect & Photon Lab, Photon Technol Dept, Los Angeles, CA 90009 USA Aerosp Corp, Phys Sci Labs, Elect & Photon Lab, Photon Technol Dept, Los Angeles, CA 90009 USA

Tockstein, Michael A.
论文数: 0 引用数: 0
h-index: 0
机构:
Aerosp Corp, Phys Sci Labs, Elect & Photon Lab, Microelect Technol Dept, Los Angeles, CA 90009 USA Aerosp Corp, Phys Sci Labs, Elect & Photon Lab, Photon Technol Dept, Los Angeles, CA 90009 USA

Brewe, Dale L.
论文数: 0 引用数: 0
h-index: 0
机构:
Argonne Natl Lab, Adv Photon Source, PNC XSD Facil Sect 20, Argonne, IL USA Aerosp Corp, Phys Sci Labs, Elect & Photon Lab, Photon Technol Dept, Los Angeles, CA 90009 USA

Wells, Nathan P.
论文数: 0 引用数: 0
h-index: 0
机构:
Aerosp Corp, Phys Sci Labs, Elect & Photon Lab, Photon Technol Dept, Los Angeles, CA 90009 USA Aerosp Corp, Phys Sci Labs, Elect & Photon Lab, Photon Technol Dept, Los Angeles, CA 90009 USA

Koga, Rokutaro
论文数: 0 引用数: 0
h-index: 0
机构:
Aerosp Corp, Space Sci Applicat Lab, Phys Sci Labs, Los Angeles, CA 90009 USA Aerosp Corp, Phys Sci Labs, Elect & Photon Lab, Photon Technol Dept, Los Angeles, CA 90009 USA

Gaab, Kevin M.
论文数: 0 引用数: 0
h-index: 0
机构:
Aerosp Corp, Phys Sci Labs, Elect & Photon Lab, Photon Technol Dept, Los Angeles, CA 90009 USA Aerosp Corp, Phys Sci Labs, Elect & Photon Lab, Photon Technol Dept, Los Angeles, CA 90009 USA

Lotshaw, William T.
论文数: 0 引用数: 0
h-index: 0
机构:
Aerosp Corp, Phys Sci Labs, Elect & Photon Lab, Photon Technol Dept, Los Angeles, CA 90009 USA Aerosp Corp, Phys Sci Labs, Elect & Photon Lab, Photon Technol Dept, Los Angeles, CA 90009 USA

Moss, Steven C.
论文数: 0 引用数: 0
h-index: 0
机构:
Aerosp Corp, Phys Sci Labs, Elect & Photon Lab, Microelect Technol Dept, Los Angeles, CA 90009 USA Aerosp Corp, Phys Sci Labs, Elect & Photon Lab, Photon Technol Dept, Los Angeles, CA 90009 USA
[4]
Monte-Carlo simulations of ion track in silicon and influence of its spatial distribution on single event effects
[J].
Colladant, T
;
L'Hoir, A
;
Sauvestre, JE
;
Flament, O
.
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,
2006, 245 (02)
:464-474

Colladant, T
论文数: 0 引用数: 0
h-index: 0
机构: Univ Paris 07, CNRS, UMR 7588, Inst NanoSci Paris, F-75015 Paris, France

L'Hoir, A
论文数: 0 引用数: 0
h-index: 0
机构: Univ Paris 07, CNRS, UMR 7588, Inst NanoSci Paris, F-75015 Paris, France

Sauvestre, JE
论文数: 0 引用数: 0
h-index: 0
机构: Univ Paris 07, CNRS, UMR 7588, Inst NanoSci Paris, F-75015 Paris, France

Flament, O
论文数: 0 引用数: 0
h-index: 0
机构: Univ Paris 07, CNRS, UMR 7588, Inst NanoSci Paris, F-75015 Paris, France
[5]
Using TCAD Modeling to Compare Heavy-Ion and Laser-Induced Single Event Transients in SiGe HBTs
[J].
Fleetwood, Zachary E.
;
Lourenco, Nelson E.
;
Ildefonso, Adrian
;
Warner, Jeffrey H.
;
Wachter, Mason T.
;
Hales, Joel M.
;
Tzintzarov, George N.
;
Roche, Nicolas J. -H.
;
Khachatrian, Ani
;
Buchner, Steven P.
;
McMorrow, Dale
;
Paki, Pauline
;
Cressler, John D.
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
2017, 64 (01)
:398-405

Fleetwood, Zachary E.
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA

Lourenco, Nelson E.
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA

Ildefonso, Adrian
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA

Warner, Jeffrey H.
论文数: 0 引用数: 0
h-index: 0
机构:
Naval Res Lab, Washington, DC 20375 USA Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA

Wachter, Mason T.
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA

Hales, Joel M.
论文数: 0 引用数: 0
h-index: 0
机构:
Naval Res Lab, Washington, DC 20375 USA
Sotera Def, Annapolis Jct, MD 20701 USA Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA

Tzintzarov, George N.
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA

Roche, Nicolas J. -H.
论文数: 0 引用数: 0
h-index: 0
机构:
Naval Res Lab, Washington, DC 20375 USA
George Washington Univ, Washington, DC 20052 USA Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA

Khachatrian, Ani
论文数: 0 引用数: 0
h-index: 0
机构:
Naval Res Lab, Washington, DC 20375 USA
Sotera Def, Annapolis Jct, MD 20701 USA Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA

Buchner, Steven P.
论文数: 0 引用数: 0
h-index: 0
机构:
Naval Res Lab, Washington, DC 20375 USA Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA

McMorrow, Dale
论文数: 0 引用数: 0
h-index: 0
机构:
Naval Res Lab, Washington, DC 20375 USA Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA

Paki, Pauline
论文数: 0 引用数: 0
h-index: 0
机构:
Def Threat Reduct Agcy, Ft Belvoir, VA 22060 USA Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA

Cressler, John D.
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA
[6]
Scaling Effects on Single-Event Transients in InGaAs FinFETs
[J].
Gong, Huiqi
;
Ni, Kai
;
Zhang, En Xia
;
Sternberg, Andrew L.
;
Kozub, John A.
;
Ryder, Kaitlyn L.
;
Keller, Ryan F.
;
Ryder, Landen D.
;
Weiss, Sharon M.
;
Weller, Robert A.
;
Alles, Michael L.
;
Reed, Robert A.
;
Fleetwood, Daniel M.
;
Schrimpf, Ronald D.
;
Vardi, Alon
;
del Alamo, Jesus A.
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
2018, 65 (01)
:296-303

Gong, Huiqi
论文数: 0 引用数: 0
h-index: 0
机构:
Vanderbilt Univ, Dept Elect Engn & Comp Sci, 221 Kirkland Hall, Nashville, TN 37235 USA Vanderbilt Univ, Dept Elect Engn & Comp Sci, 221 Kirkland Hall, Nashville, TN 37235 USA

Ni, Kai
论文数: 0 引用数: 0
h-index: 0
机构:
Vanderbilt Univ, Dept Elect Engn & Comp Sci, 221 Kirkland Hall, Nashville, TN 37235 USA Vanderbilt Univ, Dept Elect Engn & Comp Sci, 221 Kirkland Hall, Nashville, TN 37235 USA

Zhang, En Xia
论文数: 0 引用数: 0
h-index: 0
机构:
Vanderbilt Univ, Dept Elect Engn & Comp Sci, 221 Kirkland Hall, Nashville, TN 37235 USA Vanderbilt Univ, Dept Elect Engn & Comp Sci, 221 Kirkland Hall, Nashville, TN 37235 USA

Sternberg, Andrew L.
论文数: 0 引用数: 0
h-index: 0
机构:
Vanderbilt Univ, Dept Elect Engn & Comp Sci, 221 Kirkland Hall, Nashville, TN 37235 USA Vanderbilt Univ, Dept Elect Engn & Comp Sci, 221 Kirkland Hall, Nashville, TN 37235 USA

Kozub, John A.
论文数: 0 引用数: 0
h-index: 0
机构:
Vanderbilt Univ, Dept Phys, Nashville, TN 37235 USA Vanderbilt Univ, Dept Elect Engn & Comp Sci, 221 Kirkland Hall, Nashville, TN 37235 USA

Ryder, Kaitlyn L.
论文数: 0 引用数: 0
h-index: 0
机构:
Vanderbilt Univ, Dept Elect Engn & Comp Sci, 221 Kirkland Hall, Nashville, TN 37235 USA Vanderbilt Univ, Dept Elect Engn & Comp Sci, 221 Kirkland Hall, Nashville, TN 37235 USA

Keller, Ryan F.
论文数: 0 引用数: 0
h-index: 0
机构:
Vanderbilt Univ, Dept Elect Engn & Comp Sci, 221 Kirkland Hall, Nashville, TN 37235 USA Vanderbilt Univ, Dept Elect Engn & Comp Sci, 221 Kirkland Hall, Nashville, TN 37235 USA

Ryder, Landen D.
论文数: 0 引用数: 0
h-index: 0
机构:
Vanderbilt Univ, Dept Elect Engn & Comp Sci, 221 Kirkland Hall, Nashville, TN 37235 USA Vanderbilt Univ, Dept Elect Engn & Comp Sci, 221 Kirkland Hall, Nashville, TN 37235 USA

Weiss, Sharon M.
论文数: 0 引用数: 0
h-index: 0
机构:
Vanderbilt Univ, Dept Elect Engn & Comp Sci, 221 Kirkland Hall, Nashville, TN 37235 USA Vanderbilt Univ, Dept Elect Engn & Comp Sci, 221 Kirkland Hall, Nashville, TN 37235 USA

Weller, Robert A.
论文数: 0 引用数: 0
h-index: 0
机构:
Vanderbilt Univ, Dept Elect Engn & Comp Sci, 221 Kirkland Hall, Nashville, TN 37235 USA Vanderbilt Univ, Dept Elect Engn & Comp Sci, 221 Kirkland Hall, Nashville, TN 37235 USA

Alles, Michael L.
论文数: 0 引用数: 0
h-index: 0
机构:
Vanderbilt Univ, Dept Elect Engn & Comp Sci, 221 Kirkland Hall, Nashville, TN 37235 USA Vanderbilt Univ, Dept Elect Engn & Comp Sci, 221 Kirkland Hall, Nashville, TN 37235 USA

Reed, Robert A.
论文数: 0 引用数: 0
h-index: 0
机构:
Vanderbilt Univ, Dept Elect Engn & Comp Sci, 221 Kirkland Hall, Nashville, TN 37235 USA Vanderbilt Univ, Dept Elect Engn & Comp Sci, 221 Kirkland Hall, Nashville, TN 37235 USA

Fleetwood, Daniel M.
论文数: 0 引用数: 0
h-index: 0
机构:
Vanderbilt Univ, Dept Elect Engn & Comp Sci, 221 Kirkland Hall, Nashville, TN 37235 USA Vanderbilt Univ, Dept Elect Engn & Comp Sci, 221 Kirkland Hall, Nashville, TN 37235 USA

Schrimpf, Ronald D.
论文数: 0 引用数: 0
h-index: 0
机构:
Vanderbilt Univ, Dept Elect Engn & Comp Sci, 221 Kirkland Hall, Nashville, TN 37235 USA Vanderbilt Univ, Dept Elect Engn & Comp Sci, 221 Kirkland Hall, Nashville, TN 37235 USA

Vardi, Alon
论文数: 0 引用数: 0
h-index: 0
机构:
MIT, Microsyst Technol Labs, Cambridge, MA 02139 USA Vanderbilt Univ, Dept Elect Engn & Comp Sci, 221 Kirkland Hall, Nashville, TN 37235 USA

del Alamo, Jesus A.
论文数: 0 引用数: 0
h-index: 0
机构:
MIT, Microsyst Technol Labs, Cambridge, MA 02139 USA Vanderbilt Univ, Dept Elect Engn & Comp Sci, 221 Kirkland Hall, Nashville, TN 37235 USA
[7]
New Approach for Pulsed-Laser Testing That Mimics Heavy-Ion Charge Deposition Profiles
[J].
Hales, Joel M.
;
Cressler, John D.
;
McMorrow, Dale
;
Khachatrian, Ani
;
Buchner, Stephen
;
Warner, Jeffrey
;
Ildefonso, Adrian
;
Tzintzarov, George N.
;
Nergui, Delgermaa
;
Monahan, Daniele M.
;
LaLumondiere, Stephen D.
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
2020, 67 (01)
:81-90

Hales, Joel M.
论文数: 0 引用数: 0
h-index: 0
机构:
KeyW Corp, Herndon, VA 20171 USA
US Naval Res Lab, Washington, DC 20375 USA KeyW Corp, Herndon, VA 20171 USA

Cressler, John D.
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA KeyW Corp, Herndon, VA 20171 USA

McMorrow, Dale
论文数: 0 引用数: 0
h-index: 0
机构:
US Naval Res Lab, Washington, DC 20375 USA KeyW Corp, Herndon, VA 20171 USA

Khachatrian, Ani
论文数: 0 引用数: 0
h-index: 0
机构:
US Naval Res Lab, Washington, DC 20375 USA KeyW Corp, Herndon, VA 20171 USA

Buchner, Stephen
论文数: 0 引用数: 0
h-index: 0
机构:
US Naval Res Lab, Washington, DC 20375 USA KeyW Corp, Herndon, VA 20171 USA

Warner, Jeffrey
论文数: 0 引用数: 0
h-index: 0
机构:
US Naval Res Lab, Washington, DC 20375 USA KeyW Corp, Herndon, VA 20171 USA

Ildefonso, Adrian
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA KeyW Corp, Herndon, VA 20171 USA

Tzintzarov, George N.
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA KeyW Corp, Herndon, VA 20171 USA

Nergui, Delgermaa
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA KeyW Corp, Herndon, VA 20171 USA

Monahan, Daniele M.
论文数: 0 引用数: 0
h-index: 0
机构:
Aerosp Corp, POB 92957, Los Angeles, CA 90009 USA KeyW Corp, Herndon, VA 20171 USA

LaLumondiere, Stephen D.
论文数: 0 引用数: 0
h-index: 0
机构:
Aerosp Corp, POB 92957, Los Angeles, CA 90009 USA KeyW Corp, Herndon, VA 20171 USA
[8]
Experimental Validation of an Equivalent LET Approach for Correlating Heavy-Ion and Laser-Induced Charge Deposition
[J].
Hales, Joel M.
;
Khachatrian, Ani
;
Buchner, Stephen
;
Roche, Nicolas J. -H.
;
Warner, Jeffrey
;
Fleetwood, Zachary E.
;
Ildefonso, Adrian
;
Cressler, John D.
;
Ferlet-Cavrois, Veronique
;
McMorrow, Dale
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
2018, 65 (08)
:1724-1733

Hales, Joel M.
论文数: 0 引用数: 0
h-index: 0
机构:
Sotera Def, Annapolis Jct, MD 20701 USA
US Naval Res Lab, Washington, DC 20375 USA Sotera Def, Annapolis Jct, MD 20701 USA

Khachatrian, Ani
论文数: 0 引用数: 0
h-index: 0
机构:
Sotera Def, Annapolis Jct, MD 20701 USA
US Naval Res Lab, Washington, DC 20375 USA Sotera Def, Annapolis Jct, MD 20701 USA

Buchner, Stephen
论文数: 0 引用数: 0
h-index: 0
机构:
US Naval Res Lab, Washington, DC 20375 USA Sotera Def, Annapolis Jct, MD 20701 USA

Roche, Nicolas J. -H.
论文数: 0 引用数: 0
h-index: 0
机构:
US Naval Res Lab, Washington, DC 20375 USA
George Washington Univ, Washington, DC 20052 USA
Univ Montpellier, F-34090 Montpellier, France Sotera Def, Annapolis Jct, MD 20701 USA

Warner, Jeffrey
论文数: 0 引用数: 0
h-index: 0
机构:
US Naval Res Lab, Washington, DC 20375 USA Sotera Def, Annapolis Jct, MD 20701 USA

Fleetwood, Zachary E.
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA Sotera Def, Annapolis Jct, MD 20701 USA

Ildefonso, Adrian
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA Sotera Def, Annapolis Jct, MD 20701 USA

Cressler, John D.
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA Sotera Def, Annapolis Jct, MD 20701 USA

Ferlet-Cavrois, Veronique
论文数: 0 引用数: 0
h-index: 0
机构:
European Space Agcy, ESA ESTEC, NL-2200 AG Noordwijk, Netherlands Sotera Def, Annapolis Jct, MD 20701 USA

McMorrow, Dale
论文数: 0 引用数: 0
h-index: 0
机构:
US Naval Res Lab, Washington, DC 20375 USA Sotera Def, Annapolis Jct, MD 20701 USA
[9]
A Simplified Approach for Predicting Pulsed-Laser-Induced Carrier Generation in Semiconductors
[J].
Hales, Joel M.
;
Khachatrian, Ani
;
Buchner, Stephen
;
Roche, Nicolas J. -H.
;
Warner, Jeffrey
;
McMorrow, Dale
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
2017, 64 (03)
:1006-1013

Hales, Joel M.
论文数: 0 引用数: 0
h-index: 0
机构:
Sotera Def, Annapolis Jct, MD 20701 USA
US Naval Res Lab, Washington, DC 20375 USA Sotera Def, Annapolis Jct, MD 20701 USA

Khachatrian, Ani
论文数: 0 引用数: 0
h-index: 0
机构:
Sotera Def, Annapolis Jct, MD 20701 USA
US Naval Res Lab, Washington, DC 20375 USA Sotera Def, Annapolis Jct, MD 20701 USA

Buchner, Stephen
论文数: 0 引用数: 0
h-index: 0
机构:
US Naval Res Lab, Washington, DC 20375 USA Sotera Def, Annapolis Jct, MD 20701 USA

Roche, Nicolas J. -H.
论文数: 0 引用数: 0
h-index: 0
机构:
US Naval Res Lab, Washington, DC 20375 USA
George Washington Univ, Washington, DC 20052 USA Sotera Def, Annapolis Jct, MD 20701 USA

Warner, Jeffrey
论文数: 0 引用数: 0
h-index: 0
机构:
US Naval Res Lab, Washington, DC 20375 USA Sotera Def, Annapolis Jct, MD 20701 USA

McMorrow, Dale
论文数: 0 引用数: 0
h-index: 0
机构:
US Naval Res Lab, Washington, DC 20375 USA Sotera Def, Annapolis Jct, MD 20701 USA
[10]
Comparison of Single-Event Transients in SiGe HBTs on Bulk and Thick-Film SOI
[J].
Ildefonso, Adrian
;
Warner, Jeffrey H.
;
Cressler, John D.
;
Tzintzarov, George N.
;
Nergui, Delgermaa
;
Omprakash, Anup P.
;
Goley, Patrick S.
;
Hales, Joel M.
;
Khachatrian, Ani
;
Buchner, Stephen P.
;
McMorrow, Dale
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
2020, 67 (01)
:71-80

Ildefonso, Adrian
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA

Warner, Jeffrey H.
论文数: 0 引用数: 0
h-index: 0
机构:
US Naval Res Lab NRL, Washington, DC 20052 USA Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA

Cressler, John D.
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA

Tzintzarov, George N.
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA

Nergui, Delgermaa
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA

Omprakash, Anup P.
论文数: 0 引用数: 0
h-index: 0
机构:
Raytheon Co, El Segundo, CA 90245 USA Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA

Goley, Patrick S.
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA

Hales, Joel M.
论文数: 0 引用数: 0
h-index: 0
机构:
US Naval Res Lab, KeyW Corp, Herndon, VA 20171 USA Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA

Khachatrian, Ani
论文数: 0 引用数: 0
h-index: 0
机构:
US Naval Res Lab NRL, Washington, DC 20052 USA Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA

Buchner, Stephen P.
论文数: 0 引用数: 0
h-index: 0
机构:
US Naval Res Lab NRL, Washington, DC 20052 USA Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA

McMorrow, Dale
论文数: 0 引用数: 0
h-index: 0
机构:
US Naval Res Lab NRL, Washington, DC 20052 USA Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA