Effect of strain on tunability in Ba0.60Sr 0.40TiO3 thin films on Pt-Si substrates

被引：0

作者：

Potrepka, D.M. ^{[1
]}

Hirsch, S. ^{[2
]}

Cole, M.W. ^{[2
]}

Nothwang, W.D. ^{[2
]}

Zhong, S. ^{[3
]}

Alpay, S.P. ^{[3
]}

机构：

[1] Sensors and Electron Devices Directorate, U.S. Army Research Laboratory, Adelphi, MD 20783

[2] Weapons and Materials Research Directorate, Active Materials Research Group, U.S. Army Research Laboratory, Aberdeen Proving Ground, MD 21005

[3] Department of Materials Science and Engineering, Institute of Materials Science, University of Connecticut, Storrs, CT 06269

来源：

Journal of Applied Physics | 2006年 / 99卷 / 01期

关键词：

Thin films;

D O I：

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摘要：

Journal article (JA)

引用

页码：1 / 6