Adaptive Cross Transformer With Contrastive Learning for Surface Defect Detection

被引:0
作者
Huang, Xiaohua [1 ,2 ,3 ,4 ]
Li, Yang [1 ,2 ]
Bao, Yongqiang [5 ,6 ]
Zheng, Wenming [7 ,8 ]
机构
[1] Nanjing Inst Technol, Sch Int Educ, Nanjing 211167, Jiangsu, Peoples R China
[2] Nanjing Inst Technol, Oulu Sch, Nanjing 211167, Jiangsu, Peoples R China
[3] Southeast Univ, Key Lab Child Dev & Learning Sci, Minist Educ, Nanjing 210096, Peoples R China
[4] Southeast Univ, Res Ctr Learning Sci, Nanjing 210096, Peoples R China
[5] Nanjing Inst Technol, Sch Commun & Artificial Intelligence, Nanjing 211167, Jiangsu, Peoples R China
[6] Nanjing Inst Technol, Sch Integrated Circuit, Nanjing 211167, Jiangsu, Peoples R China
[7] Southeast Univ, Sch Biol Sci & Med Engn, Key Lab Child Dev & Learning Sci, Minist Educ, Nanjing 210096, Peoples R China
[8] Pazhou Lab, Guangzhou 510320, Peoples R China
基金
中国国家自然科学基金;
关键词
Defect detection; Transformers; Feature extraction; Contrastive learning; Surface treatment; Object detection; Few shot learning; Adaptation models; Steel; Metalearning; Learnable adapter module; metalearning; self-supervised contrastive learning (SCL); surface defect detection; vision transformer;
D O I
10.1109/TIM.2024.3470998
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The presence of surface irregularities poses a significant threat to the quality of industrial products. Vision-based surface defect detection, known for its objectivity and stability, is extensively studied. Yet, accurately locating and discerning diverse defects proves challenging due to data scarcity and the diversity of defect types. To address these issues, we propose a new adaptive cross transformer with self-supervised contrastive learning, namely, ACViT-SCL, for surface defect detection. In ACViT, the cross transformer, as a model based on the Transformer architecture, is leveraged to address data scarcity issues through metalearning pipeline. Furthermore, the adaptive cross transformer is proposed to enhance the generalization of the cross Transformer across various defect detection tasks. Finally, the self-supervised contrastive learning (CL) is incorporated to enhance feature distinctiveness, fortifying resilience against diverse defects. To demonstrate the superiority and robustness of the proposed method, the performance comparison between ACViT-SCL and state-of-the-art methods is conducted on three surface defect datasets. The results demonstrate that ACViT-SCL outperforms competing methods in terms of accuracy and generalization ability.
引用
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页数:17
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