Hot-spot Temperature Inversion for Metallized Film Capacitors Based on Conjugate Gradient Method

被引:0
作者
Li, Haobo [1 ]
Li, Hua [1 ]
Zhang, Guohao [1 ]
Lan, Jing [1 ]
Lin, Fuchang [1 ]
Sun, Pei [2 ]
机构
[1] State Key Laboratory of Advanced Electromagnetic Technology, School of Electrical and Electronic Engineering, Huazhong University of Science & Technology, Wuhan
[2] State Grid Shanghai Municupal Electric Power Company, Shanghai
来源
Gaodianya Jishu/High Voltage Engineering | 2024年 / 50卷 / 09期
关键词
conjugate gradient method; hot-spot temperature rise; inversion model; metallized film capacitors; surface temperature rise;
D O I
10.13336/j.1003-6520.hve.20230874
中图分类号
学科分类号
摘要
Hot-spot temperature is one of the important factors affecting the insulation life of metallized film capacitors, because it can not be measured directly but be usually obtained by thermal simulation analysis or temperature inversion. This paper proposes a hot-spot temperature inversion model based on the conjugate gradient method (CG). The inversion model establishes the temperature distribution objective function of the internal heat transfer process, adopts the finite difference method to solve the capacitor temperature field, and adopts CG to analyze the internal temperature distribution by iterative solution. At the same time, an AC temperature rise test is carried out to check the simulation model and the inversion model. The results show that there is a linear relationship between the hot-spot temperature rise and the surface temperature rise, the hot-spot temperature appears in the center of the MFC near the mandrel, and the maximum error between the inversion and the simulation model is 4.35%, which indicates that the model can realize the effective prediction of temperature distribution and hot-spot distribution under field working conditions. © 2024 Science Press. All rights reserved.
引用
收藏
页码:4163 / 4170
页数:7
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