Electric-field induced morphological transitions in elastic contact instability of soft solid films

被引：0

作者：

Arun, N. ^{[1
]}

Sarkar, J. ^{[2
]}

Sharma, Ashutosh ^{[2
]}

Shenoy, V.B. ^{[3
]}

Narayan, K.S. ^{[1
]}

机构：

[1] Jawaharlal Nehru Centre for Advanced Scientific Research, Bangalore, India

[2] Department of Chemical Engineering, Indian Institute of Technology, Kanpur, India

[3] Material Research Centre, Centre for Condensed Matter Theory, Indian Institute of Science, Bangalore, India

来源：

Journal of Adhesion | 2007年 / 83卷 / 06期

关键词：

A soft elastic film; when placed in adhesive proximity with a contactor in a crack-like geometry; spontaneously undergoes a surface instability to form finger patterns with a characteristic wavelength of approximately 4h; where h is the film thickness. We study the morphological evolution and control of this elastic contact instability under the influence of an external electric field. The distinct electric field induced morphological changes; leading to the formation of two-dimensional hexagonally arranged pillars; large-amplitude fingers; and straightening of contact edge; which are studied comprehensively. The conditions for the evolution of morphologically distinct patterns are governed by the film parameters; such as its shear modulus and thickness. A theoretical model and its stability analysis provide an approximate estimate of the critical voltage required for the onset of changes and its scaling with the film parameters (thickness and shear modulus). Further; three-dimensional simulations based on energy minimization are presented to provide important clues regarding the physics of pattern evolution on soft elastic interfaces;

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摘要：

Journal article (JA)

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页码：513 / 534