Simulation and design of Si-photodetector in standard CMOS process

被引：0
作者：
Bian, Jian-Tao [1 ]
Chen, Chao [1 ]
机构：
[1] Department of Physics, Xiamen University, Xiamen 361005, China
来源：
Bandaoti Guangdian/Semiconductor Optoelectronics | 2006年 / 27卷 / 02期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：128 / 132
相关论文
共 50 条
[1]   Simulation and design of a CMOS-process-compatible high-speed Si-photodetector [J].
Mao, Luhong ;
Chen, Hongda ;
Wu, Ronghan ;
Tang, Jun ;
Liang, Kun ;
Nian, Hua ;
Guo, Weilian ;
Li, Shurong ;
Wu, Xiawan .
Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors, 2002, 23 (02) :193-197
[2]   Simulation and design of Si double-photodetector for monolithic OEIC in standard CMOS technology - art. no. 602031 [J].
Bian, JT ;
Chen, C ;
Xie, S .
Optoelectronic Materials and Devices for Optical Communications, 2005, 6020 :2031-2031
[3]   Design and simulation of a novel CMOS superimposed photodetector [J].
康玉琢 ;
毛陆虹 ;
肖新东 ;
谢生 ;
张世林 .
Optoelectronics Letters, 2012, 8 (04) :249-252
[4]   Design and simulation of a novel CMOS superimposed photodetector [J].
Kang Y.-z. ;
Mao L.-h. ;
Xiao X.-d. ;
Xie S. ;
Zhang S.-l. .
Optoelectronics Letters, 2012, 8 (4) :249-252
[5]   A novel integrated ultraviolet photodetector based on standard CMOS process [J].
Wang Han ;
Jin Xiang-Liang ;
Chen Chang-Ping ;
Tian Man-Fang ;
Zhu Ke-Han .
CHINESE PHYSICS B, 2015, 24 (03)
[6]   A novel integrated ultraviolet photodetector based on standard CMOS process [J].
汪涵 ;
金湘亮 ;
陈长平 ;
田满芳 ;
朱柯翰 .
Chinese Physics B, 2015, 24 (03) :422-426
[7]   Ultraviolet enhanced Si-photodetector using p-NiO films [J].
Choi, JM ;
Im, S .
APPLIED SURFACE SCIENCE, 2005, 244 (1-4) :435-438
[8]   Design and simulation of thermal actuators for STM applications in a standard CMOS process [J].
Eagle, S ;
Lakdawala, H ;
Fedder, GK .
MATERIALS AND DEVICE CHARACTERIZATION IN MICROMACHINING II, 1999, 3875 :32-39
[9]   Design and optimization of high-performance slot-microring Si-photodetector based on internal photoemission effect [J].
Hosseinifar, Mitra ;
Ahmadi, Vahid ;
Ebnali-Heidari, Majid .
OPTICS COMMUNICATIONS, 2017, 397 :10-16
[10]   Accuracy of distance measurement based on two-photon absorption of Si-photodetector [J].
Oiwa, Fatsuya ;
Shioda, Tatsutoshi ;
Tanaka, Yosuke ;
Takeda, Mitsuo ;
Kurokawa, Takashi .
2007 PACIFIC RIM CONFERENCE ON LASERS AND ELECTRO-OPTICS, VOLS 1-4, 2007, :405-+
12345