Trace explosive detection using photothermal deflection spectroscopy
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作者:
Krause, Adam R.
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机构:
Oak Ridge National Laboratory, Oak Ridge, TN 37831, United States
University of Tennessee, Knoxville, TN 37996, United StatesOak Ridge National Laboratory, Oak Ridge, TN 37831, United States
Krause, Adam R.
[1
,2
]
Van Neste, Charles
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机构:
Oak Ridge National Laboratory, Oak Ridge, TN 37831, United States
University of Tennessee, Knoxville, TN 37996, United StatesOak Ridge National Laboratory, Oak Ridge, TN 37831, United States
Van Neste, Charles
[1
,2
]
Senesac, Larry
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机构:
Oak Ridge National Laboratory, Oak Ridge, TN 37831, United States
University of Tennessee, Knoxville, TN 37996, United StatesOak Ridge National Laboratory, Oak Ridge, TN 37831, United States
Senesac, Larry
[1
,2
]
Thundat, Thomas
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机构:
Oak Ridge National Laboratory, Oak Ridge, TN 37831, United States
University of Tennessee, Knoxville, TN 37996, United StatesOak Ridge National Laboratory, Oak Ridge, TN 37831, United States
Thundat, Thomas
[1
,2
]
Finot, Eric
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机构:
Institut CARNOT de Bourgogne, Nanosciences-Optique Submicronique, BP 47870, F-21078 Dijon, FranceOak Ridge National Laboratory, Oak Ridge, TN 37831, United States
Finot, Eric
[3
]
机构:
[1] Oak Ridge National Laboratory, Oak Ridge, TN 37831, United States
[2] University of Tennessee, Knoxville, TN 37996, United States
[3] Institut CARNOT de Bourgogne, Nanosciences-Optique Submicronique, BP 47870, F-21078 Dijon, France