Size effect of Young's modulus in AlN thin layers

被引:0
|
作者
机构
[1] Hähnlein, Bernd
[2] Schaaf, Peter
[3] Pezoldt, Jörg
来源
Hähnlein, Bernd | 1600年 / American Institute of Physics Inc.卷 / 116期
关键词
29;
D O I
暂无
中图分类号
学科分类号
摘要
Journal article (JA)
引用
收藏
相关论文
共 50 条
  • [1] Size effect of Young's modulus in AlN thin layers
    Haehnlein, Bernd
    Schaaf, Peter
    Pezoldt, Joerg
    JOURNAL OF APPLIED PHYSICS, 2014, 116 (12)
  • [2] Size effect on Young's modulus of thin chromium cantilevers
    Nilsson, SG
    Borrisé, X
    Montelius, L
    APPLIED PHYSICS LETTERS, 2004, 85 (16) : 3555 - 3557
  • [3] The apparent increase of the Young's modulus in thin cement layers
    De Jager, N
    Pallav, P
    Feilzer, AJ
    DENTAL MATERIALS, 2004, 20 (05) : 457 - 462
  • [4] Size effect of the silicon carbide Young's modulus
    Haehnlein, Bernd
    Kovac, Jaroslav, Jr.
    Pezoldt, Joerg
    PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2017, 214 (04):
  • [5] Simultaneous measurement of the Young's modulus and the Poisson ratio of thin elastic layers
    Gross, Wolfgang
    Kress, Holger
    SOFT MATTER, 2017, 13 (05) : 1048 - 1055
  • [6] The size effect in young's modulus of nano composite ceramics
    Liu Xiequan
    Ni Xinhua
    Liu Jingzhi
    Li Baofeng
    RARE METAL MATERIALS AND ENGINEERING, 2007, 36 : 131 - 133
  • [7] The size effect in young's modulus of nano composite ceramics
    Liu, Xiequan
    Ni, Xinhua
    Liu, Jingzhi
    Li, Baofeng
    Xiyou Jinshu Cailiao Yu Gongcheng/Rare Metal Materials and Engineering, 2007, 36 (SUPPL. 2): : 131 - 133
  • [8] EFFECT OF SPECIMEN SIZE ON YOUNG'S MODULUS OF ELECTRODEPOSITED Ni
    Wang, Hong
    Liu, Rui
    Mao, Sheng-Ping
    Tang, Jun
    Zhang, Cong-Chun
    Ding, Gui-Fu
    SURFACE REVIEW AND LETTERS, 2009, 16 (02) : 303 - 307
  • [9] Size and temperature effect of Young's modulus of boron nitride nanosheet
    Qin, Hongfa
    Liang, Yingjing
    Huang, Jianzhang
    JOURNAL OF PHYSICS-CONDENSED MATTER, 2020, 32 (03)
  • [10] Effect of specimen size on Young's modulus and fracture strength of polysilicon
    Sharpe, WN
    Jackson, KM
    Hemker, KJ
    Xie, ZL
    JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 2001, 10 (03) : 317 - 326