Piezo dynamic force measurement in semiconductor manufacturing

被引：0
|
作者：
Hillinger, Robert [1 ]
机构：
[1] Kistler Group, Switzerland
来源：
Electronics World | / 127卷 / 2010期
关键词：
Smart manufacturing;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The advance of 5G, IoT and Big Data, as well as new technology introductions, places greater demands on semiconductors. As application requirements become more complex, so does the need for better-performing semiconductors, which in turn makes their production more challenging.
引用
收藏
页码：24 / 25
相关论文
共 50 条
  • [21] The Case for Measurement and Analysis of ESD Fields in Semiconductor Manufacturing
    Maloney, Timothy J.
    2018 IEEE SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL INTEGRITY AND POWER INTEGRITY (EMC, SI & PI), 2018, : 396 - 401
  • [22] Measuring Dynamic Capabilities: Practices and Performance in Semiconductor Manufacturing
    Macher, Jeffrey T.
    Mowery, David C.
    BRITISH JOURNAL OF MANAGEMENT, 2009, 20 : S41 - S62
  • [23] EVALUATING THE IMPACT OF DYNAMIC QUALIFICATION MANAGEMENT IN SEMICONDUCTOR MANUFACTURING
    Perraudat, Antoine
    Dauzere-Peres, Stephane
    Vialletelle, Philippe
    2019 WINTER SIMULATION CONFERENCE (WSC), 2019, : 2336 - 2347
  • [24] A Dynamic Sampling Approach for Cost Reduction in Semiconductor Manufacturing
    Susto, Gian Antonio
    Maggipinto, Marco
    Zocco, Federico
    McLoone, Sean
    28TH INTERNATIONAL CONFERENCE ON FLEXIBLE AUTOMATION AND INTELLIGENT MANUFACTURING (FAIM2018): GLOBAL INTEGRATION OF INTELLIGENT MANUFACTURING AND SMART INDUSTRY FOR GOOD OF HUMANITY, 2018, 17 : 1031 - 1038
  • [25] A Novel Rescheduling Method for Dynamic Semiconductor Manufacturing Systems
    Qiao, Fei
    Ma, YuMin
    Zhou, MengChu
    Wu, QiDi
    IEEE TRANSACTIONS ON SYSTEMS MAN CYBERNETICS-SYSTEMS, 2020, 50 (05): : 1679 - 1689
  • [26] DYNAMIC FORCE MEASUREMENT WITH STRAIN GAUGES
    LEE, BE
    AMERICAN JOURNAL OF PHYSICS, 1974, 42 (02) : 108 - 110
  • [27] MEASUREMENT OF DYNAMIC FOOT FORCE DISTRIBUTIONS
    RIVERS, DB
    MAROOFI, A
    FRISHBERG, BA
    SKORMAN, SE
    MEDICINE AND SCIENCE IN SPORTS AND EXERCISE, 1981, 13 (02): : 136 - 136
  • [28] Measurement of Dynamic Bonding Force.
    Hickmann, F.
    Elektronik-Produktion & Pruftechnik, 1988, (01): : 74 - 76
  • [29] Measurement of dynamic powers and moments of force
    Peters, Manfred
    Kumme, Rolf
    TM-TECHNISCHES MESSEN, 2006, 73 (12) : 643 - 645
  • [30] The measurement of losses in the dynamic characterisation of semiconductor devices
    Lanco, L.
    De Rossi, A.
    Ducci, S.
    Leo, G.
    Marcadet, X.
    Calligaro, M.
    Berger, V.
    JOURNAL DE PHYSIQUE IV, 2006, 135 : 281 - 282
12345