Effect of trace silver on the conductivity and softening temperature of high conductivity and high heat resistance pure copper

被引:0
|
作者
Li, Weiqiang [1 ,2 ]
Liu, Haitao [1 ,2 ,3 ]
Hou, Zhenguo [1 ]
Zhang, Zihao [1 ]
Dong, Jincan [1 ]
Wang, Mengna [4 ]
Guo, Huiwen [4 ]
Song, Kexing [1 ,2 ,3 ]
机构
[1] Henan Univ Sci & Technol, Sch Mat Sci & Engn, Luoyang 471023, Peoples R China
[2] Henan Acad Sci, Inst Mat, Zhengzhou 450046, Peoples R China
[3] Henan Key Lab Adv Cond Mat, Zhengzhou 450046, Peoples R China
[4] Chinalco Luoyang Copper Proc Co Ltd, Luoyang 471039, Peoples R China
基金
中国国家自然科学基金;
关键词
Microalloying; Pure copper; Softening resistance; Recrystallization; silver; Solute segregation; HIGH-PURITY COPPER; ELECTRICAL-CONDUCTIVITY; STORED ENERGY; RECRYSTALLIZATION TEXTURES; MECHANICAL-PROPERTIES; THERMAL-STABILITY; HIGH-STRENGTH; CU; MICROSTRUCTURE; COMPOSITE;
D O I
10.1016/j.jmrt.2024.10.156
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
As a conductor material for high-power electronic devices, pure copper requires both conductivity and softening temperature. The effects of 0% (7N Cu), 0.015% (Ag150), 0.030% (Ag300), 0.045% (Ag450) and 0.059% (Ag590) Ag on the microstructure, conductivity and softening temperature of pure copper were studied. The results show that trace Ag can refine the microstructure of pure copper and improve the mechanical properties at room temperature and high temperature. The hardness values of 7N Cu, Ag150, Ag300, Ag450 and Ag590 were 112, 119.06, 122.14, 123.54 and 125.68HV, respectively, and the softening temperatures were 195, 310, 335, 344 and 345 degrees C, respectively. At the same time, the conductivity of the samples with different Ag content was more than 100.5 %IACS. The similar structure of Ag and Cu has little effect on the conductivity. On the one hand, the trace Ag element soluble in the matrix causes lattice distortion, inhibits recrystallization nucleation and grain boundary migration. On the other hand, the Ag element is polarized at the grain boundary, which reduces the grain boundary energy, decreases the atomic diffusion and increases the recrystallization temperature.
引用
收藏
页码:4749 / 4762
页数:14
相关论文
共 50 条
  • [41] Heat conductivity of copper in two-temperature state
    Migdal, K. P.
    Petrov, Yu. V.
    Il'nitsky, D. K.
    Zhakhovsky, V. V.
    Inogamov, N. A.
    Khishchenko, K. V.
    Knyazev, D. V.
    Levashov, P. R.
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2016, 122 (04):
  • [42] High Pressure Torsion of Copper; Effect of Processing Temperature on Structural Features, Microhardness and Electric Conductivity
    Kuncicka, Lenka
    Jambor, Michal
    Kral, Petr
    MATERIALS, 2023, 16 (07)
  • [43] Heat conductivity of dielectrics at high temperatures
    Pomeranchuk, I.
    JOURNAL OF PHYSICS-USSR, 1943, 7 (1-6): : 197 - 201
  • [44] Modelling the effect of temperature and free acid, silver, copper and lead concentrations on silver electrorefining electrolyte conductivity
    Aji, Arif T.
    Kalliomaki, Taina
    Wilson, Benjamin P.
    Aromaa, Jari
    Lundstrom, Mari
    HYDROMETALLURGY, 2016, 166 : 154 - 159
  • [45] Flexible transparent ITO thin film with high conductivity and high-temperature resistance
    Liu, Shuangyuan
    Xu, Xiaofei
    Jiang, Jie
    CERAMICS INTERNATIONAL, 2024, 50 (22) : 47649 - 47654
  • [46] EFFECT OF HEAT CONDUCTIVITY ON HIGH-FREQUENCY PROPERTIES OF ANTIFERROMAGNETICS
    PETROV, G
    PHYSICS OF METALS AND METALLOGRAPHY, 1966, 22 (05): : 29 - &
  • [47] HEAT CONDUCTIVITY OF ARGON AT HIGH TEMPERATURES
    VARGAFTIK, NB
    ZIMINA, NK
    HIGH TEMPERATURE, 1964, 2 (05) : 645 - +
  • [48] Nanostructured 1% silver-copper composite wires with a high tensile strength and a high electrical conductivity
    Tardieu, Simon
    Mesguich, David
    Lonjon, Antoine
    Lecouturier, Florence
    Ferreira, Nelson
    Chevallier, Geoffroy
    Proietti, Arnaud
    Estournes, Claude
    Laurent, Christophe
    MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2019, 761
  • [49] HIGH CONDUCTIVITY COPPER-ION-IMPLANTED CDS WITH ROOM TEMPERATURE DIFFUSION OF COPPER
    GWOZDZ, PS
    KOEHLER, JS
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1970, 15 (03): : 397 - &
  • [50] HIGH RESISTANCE BRIDGE FOR CONDUCTIVITY MEASUREMENTS
    UNZ, M
    JOURNAL OF SCIENTIFIC INSTRUMENTS, 1953, 30 (06): : 179 - 184