Measuring Mental Workload of Software Developers Based on Nasal Skin Temperature

被引：0

作者：

Nakasai, Keitaro ^{[1
]}

Komeda, Shin ^{[2
]}

Tsunoda, Masateru ^{[2
]}

Kashima, Masayuki ^{[3
]}

机构：

[1] Osaka Metropolitan Univ, Coll Technol, Neyagawa 5720017, Japan

[2] Kindai Univ, Higashiosaka 5778502, Japan

[3] Kagoshima Univ, Kagoshima 8908580, Japan

来源：

IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS | 2024年 / E107D卷 / 11期

关键词：

mental workload; NASA-TLX; affective engineering;

D O I：

10.1587/transinf.2024EDL8002

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

To automatically measure the mental workload of developers, existing studies have used biometric measures such as brain waves and the heart rate. However, developers are often required to equip certain devices when measuring them, and can therefore be physically burdened. In this study, we evaluated the feasibility of non-contact biometric measures based on the nasal skin temperature (NST). In the experiment, the proposed biometric measures were more accurate than non-biometric measures.

引用

页码：1444 / 1448

页数：5

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