Single-Shot Super-Resolution Phase Imaging Method Using Band-Limited Image and Its Fourier Transform Constraints via Analytic Extrapolation

被引:0
作者
Xiao, Kang [1 ,2 ]
Wang, Zhongyang [1 ]
机构
[1] Chinese Acad Sci, Shanghai Adv Res Inst, Shanghai 201210, Peoples R China
[2] Univ Chinese Acad Sci, Beijing 100049, Peoples R China
来源
APPLIED SCIENCES-BASEL | 2024年 / 14卷 / 18期
关键词
phase imaging; single-exposure; analytic extrapolation; SURFACE SHAPE MEASUREMENT; QUANTITATIVE PHASE; DIGITAL HOLOGRAPHY; RETRIEVAL; RECONSTRUCTION; PTYCHOGRAPHY; ILLUMINATION; MICROSCOPY; RESOLUTION;
D O I
10.3390/app14188466
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The phase imaging system that records the bandlimited image and its Fourier intensity (BIFT) is a single-shot phase retrieval method with the guarantee of uniqueness and global convergence properties. However, the resolution is limited by the bandlimited imaging system and cannot investigate detailed structures under diffraction limitations. Previous efforts to address such issues focused on synthetic aperture techniques but sacrificed time resolution. In this paper, we propose a single-shot super-resolution imaging method based on analytic extrapolation. Through imaging simulations, we have demonstrated that the resolution can be improved by 1.58 in the case of noise-free. Theoretical analysis in the presence of noise is also carried out, indicating that the enhancement of resolution was determined by signal-to-noise ratio, and the resolution can be enhanced by 1.14 to 1.34 at different signal-to-noise ratios. Based on the single-shot capability of BIFT, this method has the potential to achieve fast and high-throughput phase imaging.
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页数:14
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