An 11-bit low power column-parallel single slope ADC with comparator toggle prediction technique for CMOS image sensor

被引:0
|
作者
Shi, Xiaolin [1 ]
Li, Shaomeng [2 ]
Nie, Kaiming [2 ]
机构
[1] Tianjin Univ Commerce, Sch Informat Engn, Tianjin 300134, Peoples R China
[2] Tianjin Univ, Sch Microelect, Tianjin 300072, Peoples R China
关键词
CMOS image sensor; Column-parallel SS ADC; Low power; Digital CDS;
D O I
10.1016/j.mejo.2024.106427
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper proposes an 11-bit low power column-parallel SS ADC with DCDS for CMOS image sensors. The proposed SS ADC reduces the power consumption in three ways. Firstly, using a combination of coarse and fine quantization can reduce power consumption of counter. Secondly, changing the operation state can remove the bit width inverter. Thirdly, the comparator power is reduced by making each column of comparators switch off after the end of the comparison function. The proposed ADC is fabricated in a 110 nm 1P4M CMOS technology and has a DNL of +0.64/-0.54 LSB and an INL of +0.04/-6.7 LSB at a sampling frequency of 29.9 kS/s. The single column SS ADC has the power consumption ranging from 39.6 mu W to 74.87 mu W. Compared with the conventional SS ADC, the minimum and the maximum reduction of the power consumption are 20.1 % and 43.8 %, respectively. The average power saving is 34.5 %.
引用
收藏
页数:10
相关论文
共 50 条
  • [21] A low-power high-quality CMOS image sensor using 1.5 V 4T pinned photodiode and dual-CDS column-parallel single-slope ADC
    Xu, Wenjing
    Chen, Jie
    Kuang, Zhangqu
    Zhou, Li
    Chen, Ming
    Zhang, Chengbin
    JOURNAL OF SEMICONDUCTORS, 2022, 43 (08)
  • [22] A dual-exposure wide dynamic range CMOS image sensor with 12 bit column-parallel incremental sigma-delta ADC
    Liu, Yun-Tao
    Xing, Dong-Yang
    Wang, Ying
    Chen, Jie
    MICROELECTRONICS JOURNAL, 2016, 55 : 189 - 194
  • [23] A 12-Bit High-Speed Column-Parallel Two-Step Single-Slope Analog-to-Digital Converter (ADC) for CMOS Image Sensors
    Lyu, Tao
    Yao, Suying
    Nie, Kaiming
    Xu, Jiangtao
    SENSORS, 2014, 14 (11) : 21603 - 21625
  • [24] A self-compensated approach for ramp kickback noise in CMOS image sensor column parallel single slope ADC
    Guo, Zhongjie
    Yu, Ningmei
    Wu, Longsheng
    MICROELECTRONICS JOURNAL, 2022, 120
  • [25] A low power dissipation high-speed CMOS image sensor with column-parallel sigma-delta ADCs
    Liu, Yun-Tao
    Xing, Dong-Yang
    Wang, Ying
    Chen, Jie
    MICROELECTRONICS JOURNAL, 2015, 46 (09) : 860 - 868
  • [26] An area-effective and low-power single-slope ADC for DCG imaging CMOS image sensor
    Yang, Rui
    Wang, Xiuyu
    Liu, Changju
    Ma, Biao
    Nie, Kaiming
    Xu, Jiangtao
    INTERNATIONAL JOURNAL OF CIRCUIT THEORY AND APPLICATIONS, 2025, 53 (01) : 1 - 12
  • [27] A 2.72 μs row conversion time 11-bit column-parallel single-slope analog to digital converter with differential-clocks-assisted time to digital converter interpolation for complementary metal oxide semiconductors image sensor
    Duan, Hao
    Nie, Kaiming
    Xu, Jiangtao
    INTERNATIONAL JOURNAL OF CIRCUIT THEORY AND APPLICATIONS, 2024, 52 (12) : 6056 - 6072
  • [28] 10-Bit single-slope ADC with error calibration for TDI CMOS image sensor
    Gao C.
    Yao S.
    Yang Z.
    Gao J.
    Xu J.
    Yao, S. (syyao@tju.edu.cn), 2013, Tianjin University (19): : 300 - 306
  • [29] 10-Bit Single-Slope ADC with Error Calibration for TDI CMOS Image Sensor
    高岑
    姚素英
    杨志勋
    高静
    徐江涛
    Transactions of Tianjin University, 2013, (04) : 300 - 306
  • [30] A Single Slope ADC With Row-Wise Noise Reduction Technique for CMOS Image Sensor
    Nie, Kaiming
    Zha, Wanbin
    Shi, Xiaolin
    Li, Jiawen
    Xu, Jiangtao
    Ma, Jianguo
    IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2020, 67 (09) : 2873 - 2882