5G Physical Layer Resiliency Enhancements with NB-IoT Use Case Study
被引:0
作者:
Cheng, Xiang
论文数: 0引用数: 0
h-index: 0
机构:
Virginia Tech, Wireless@VT, Bradley Department of Ece, Blacksburg,VA, United StatesVirginia Tech, Wireless@VT, Bradley Department of Ece, Blacksburg,VA, United States
Cheng, Xiang
[1
]
Yang, Hanchao
论文数: 0引用数: 0
h-index: 0
机构:
Virginia Tech, Wireless@VT, Bradley Department of Ece, Blacksburg,VA, United StatesVirginia Tech, Wireless@VT, Bradley Department of Ece, Blacksburg,VA, United States
Yang, Hanchao
[1
]
Jakubisin, D.J.
论文数: 0引用数: 0
h-index: 0
机构:
Virginia Tech National Security Institute, Blacksburg,VA, United StatesVirginia Tech, Wireless@VT, Bradley Department of Ece, Blacksburg,VA, United States
Jakubisin, D.J.
[2
]
Tripathi, N.
论文数: 0引用数: 0
h-index: 0
机构:
Virginia Tech, Wireless@VT, Bradley Department of Ece, Blacksburg,VA, United StatesVirginia Tech, Wireless@VT, Bradley Department of Ece, Blacksburg,VA, United States
Tripathi, N.
[1
]
Anderson, G.
论文数: 0引用数: 0
h-index: 0
机构:
Lockheed Martin, Cherry Hill,NJ, United StatesVirginia Tech, Wireless@VT, Bradley Department of Ece, Blacksburg,VA, United States
Anderson, G.
[3
]
Wang, A.K.
论文数: 0引用数: 0
h-index: 0
机构:
Virginia Tech National Security Institute, Blacksburg,VA, United StatesVirginia Tech, Wireless@VT, Bradley Department of Ece, Blacksburg,VA, United States
Wang, A.K.
[2
]
Yang, Y.
论文数: 0引用数: 0
h-index: 0
机构:
Virginia Tech, Wireless@VT, Bradley Department of Ece, Blacksburg,VA, United StatesVirginia Tech, Wireless@VT, Bradley Department of Ece, Blacksburg,VA, United States
Yang, Y.
[1
]
Reed, J.H.
论文数: 0引用数: 0
h-index: 0
机构:
Virginia Tech, Wireless@VT, Bradley Department of Ece, Blacksburg,VA, United StatesVirginia Tech, Wireless@VT, Bradley Department of Ece, Blacksburg,VA, United States
Reed, J.H.
[1
]
机构:
[1] Virginia Tech, Wireless@VT, Bradley Department of Ece, Blacksburg,VA, United States
[2] Virginia Tech National Security Institute, Blacksburg,VA, United States
[3] Lockheed Martin, Cherry Hill,NJ, United States