Device Image-IV Mapping using Variational Autoencoder for Inverse Design and Forward Prediction

被引：0

作者：

Lu, Thomas ^{[1
]}

Lu, Albert ^{[1
]}

Wong, Hiu Yung ^{[1
]}

机构：

[1] San Jose State University, M-PAC Lab., San Jose, United States

来源：

International Conference on Simulation of Semiconductor Processes and Devices, SISPAD | 2023年

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D O I：

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摘要：

Drain current - Electronic design automation - Forecasting - Inverse problems - Learning systems - Machine learning - MOS devices - Oxide semiconductors

引用

页码：161 / 164