Research of MEMS Pressure Sensor Stability With PDA-NFL Circuit

被引:9
作者
Basov, Mikhail [1 ]
机构
[1] Res Inst Automat VNIIA, Moscow 127055, Russia
关键词
Electric circuit; nonlinearity; pressure sensor; sensitivity; stability; temperature errors; transistor; BIPOLAR-JUNCTION-TRANSISTOR; HIGH-SENSITIVITY; STRUCTURED DIAPHRAGM; PIEZORESISTANCE; FABRICATION; STRESS; BOSS;
D O I
10.1109/JSEN.2024.3454952
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The stability of pressure sensor chip output characteristics using the piezoresistive method in the form of microelectromechanical system (MEMS) is one of the most important features for sensors. The research analyzes the changes in the useful signal, as well as errors of highly sensitive pressure sensor chips. The main feature of this development is the application of a new electrical circuit in the form of piezoresistive differential amplifier with negative feedback loop (PDA-NFL) utilizing bipolar junction transistors (BJTs), which allows to achieve a balance between high sensitivity, small chip area, and low errors. This research considers the variations of two batch with pressure sensor chip PDA-NFL samples (area 4.00 x 4.00 mm(2)) for the range of 1 kPa after 4.5 years [eight samples, sensitivity S-1 after = (40.6 +/- 6.4) mV/V/kPa, nonlinearity 2K(NL 1 after) = (0.81 +/- 0.15)%/FS] and range of 5 kPa after 3.0 years [14 samples, sensitivity S-5 after = (11.2 +/- 1.8) mV/V/kPa, nonlinearity 2K(NL 5 after) = (0.10 +/- 0.06)%/FS]. The study demonstrates the unidirectional influence of residual mechanical stresses (RMS) from the pressure sensor assembly design on sensitivity and nonlinearity when pressure is applied from different sides of chip and temperature hysteresis errors.
引用
收藏
页码:34083 / 34090
页数:8
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