Comparison of temperature, current density, and light intensity distributions of nano-resistor patterns for an improved solid state incandescent light emitting device simulation model

被引：0

作者：

Samuel, Adam ^{[1
]}

Kuo, Yue ^{[1
]}

机构：

[1] Department of Chemical Engineering, Texas A&m University, College Station,TX,77843, United States

来源：

Journal of Vacuum Science and Technology B | 2022年 / 40卷 / 05期

关键词：

Compendex;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Resistors

引用