Cryogenic electronics for noble liquid neutrino detectors

被引:0
作者
Chen H. [1 ]
Radeka V. [1 ]
机构
[1] Brookhaven National Laboratory, Upton, NY
关键词
Application-specific integrated circuit (ASIC); Cryogenic electronics; Front-end electronics for detector readout; Neutrino detectors; Noble liquid detectors; Noise; Time projection chambers;
D O I
10.1016/j.nima.2022.167571
中图分类号
学科分类号
摘要
In this paper we present the general features of cryogenic (or “cold”) electronics for noble liquid time projection chambers, with design principles and details for neutrino physics, a brief history of the technology and details of recent research and development that is driving the design of the detectors under construction. Finally, some comments on future R&D envisioned and the impact of this work on other fields is described. “Cold” in the context of this work applies to CMOS devices operated at 77 K and above, at liquids temperatures of LAr (89 K), LKr (125 K) and LXe (165 K), with most of the tests performed in, or at LN2 (77 K). The paper is concentrated on the design of cold electronics for large liquid argon TPCs, those that have been successfully operated, MicroBooNE and ProtoDUNE, and those designed or under construction, such as SBND and DUNE first and second 10 kton modules. The high performance achieved with MicroBooNE and ProtoDUNE – a high signal-to-noise ratio combined with high stability of response – is mainly due to the integral approach to design and construction of sensing electrodes with cold readout electronics in a modular approach with the cryostat signal feed-throughs incorporating warm interface electronics into a Faraday cage with the cryostat. The integral concept is described in some detail in this paper. © 2022
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共 45 条
[21]  
Abud A.A., Et al., Design, construction and operation of the ProtoDUNE-SP Liquid Argon TPC, JINST, 17, 1, (2022)
[22]  
Abi B., Et al., (2017)
[23]  
Rescia S., Radeka V., Noise model of sense wire for large liquid argon time projection chambers: Theory and experiment, 2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, and 17th Room Temperature Semiconductor Detectors Workshop, pp. 877-880, (2010)
[24]  
Ban J., Brettel H., Cwienk W.D., Fent J., Kurchaninov L., Ladygin E., Oberlack H., Schacht P., Stenzel H., Strizenec P., Cold electronics for the liquid argon hadronic end-cap calorimeter of ATLAS, Nucl. Instrum. Methods A, 556, pp. 158-168, (2006)
[25]  
De Geronimo G., Et al., Front-end ASIC for a liquid argon TPC, IEEE Trans. Nucl. Sci., 58, pp. 1376-1385, (2011)
[26]  
Li S., Ma J., De Geronimo G., Chen H., Radeka V., LAr TPC electronics CMOS lifetime at 300 K and 77 K and reliability under thermal cycling, IEEE Trans. Nucl. Sci., 60, pp. 4737-4743, (2013)
[27]  
Hoff J.R., Deptuch G.W., Wu G., Gui P., Cryogenic lifetime studies of 130 nm and 65 nm nMOS transistors for high-energy physics experiments, IEEE Trans. Nucl. Sci., 62, 3, pp. 1255-1261, (2015)
[28]  
Ma J., Hot carrier study of MOSFET at 300 K and 77 K, Stony Brook Theses and Dissertations Collection, (2015)
[29]  
Grace C., Et al., ColdADC_P2: A 16-channel cryogenic ADC ASIC for the deep underground neutrino experiment, IEEE Trans. Nucl. Sci., 69, 1, pp. 105-112, (2021)
[30]  
Savitsky Z., ICEBERG test facility, (2020)