A fluorite-structured HfO2/ZrO2/HfO2 superlattice based self-rectifying ferroelectric tunnel junction synapse

被引:2
|
作者
Lee, Dong Hyun [1 ,2 ]
Kim, Ji Eun [3 ]
Cho, Yong Hyeon [1 ,2 ]
Kim, Sojin [4 ]
Park, Geun Hyeong [1 ,2 ]
Choi, Hyojun [1 ,2 ]
Lee, Sun Young [1 ,2 ]
Kwon, Taegyu [1 ,2 ]
Kim, Da Hyun [1 ,2 ]
Jeong, Moonseek [1 ,2 ]
Jeong, Hyun Woo [1 ,2 ]
Lee, Younghwan [5 ]
Lee, Seung-Yong [4 ]
Yoon, Jung Ho [6 ]
Park, Min Hyuk [1 ,2 ,7 ]
机构
[1] Seoul Natl Univ, Coll Engn, Dept Mat Sci & Engn, Seoul 08826, South Korea
[2] Seoul Natl Univ, Coll Engn, Inter Univ Semicond Res Ctr, Seoul 08826, South Korea
[3] Korea Inst Sci & Technol KIST, Elect Mat Res Ctr, Seoul 02792, South Korea
[4] Hanyang Univ, Div Mat Sci & Engn, Seoul 04763, South Korea
[5] Chonnam Natl Univ, Dept Mat Sci & Engn, Gwangju 61186, South Korea
[6] Sungkyunkwan Univ, Sch Adv Mat Sci & Engn, Suwon 16419, South Korea
[7] Seoul Natl Univ, Inst Engn Res, Coll Engn, Gwanak Ro 1, Seoul 08826, South Korea
基金
新加坡国家研究基金会;
关键词
HAFNIUM OXIDE; THIN-FILMS; LOW-POWER; DEVICES; HFO2; RRAM;
D O I
10.1039/d4mh00519h
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
A self-rectifying ferroelectric tunnel junction that employs a HfO2/ZrO2/HfO2 superlattice (HZH SL) combined with Al2O3 and TiO2 layers is proposed. The 6 nm-thick HZH SL effectively suppresses the formation of non-ferroelectric phases while increasing remnant polarization (P-r). This enlarged P-r modulates the energy barrier configuration, consequently achieving a large on/off ratio of 1273 by altering the conduction mechanism from off-state thermal injection to on-state Fowler-Nordheim tunneling. Moreover, the asymmetric Schottky barriers at the top TiN/TiO(2)and bottom HfO2/Pt interfaces enable a self-rectifying property with a rectifying ratio of 1550. Through calculations and simulations it is found that the device demonstrates potential for achieving an integrated array size exceeding 7k while maintaining a 10% read margin, and shows potential for application in artificial synapses for neuromorphic computing with an image recognition accuracy above 92%. Finally, the self-rectifying behavior and device-to-device variation reliability are confirmed in a 9 x 9 crossbar array structure.
引用
收藏
页码:5251 / 5264
页数:15
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