An Offset-Cancellation Technique Using Charge-Trap Transistors and Asynchronous Programming Scheme

被引：0

作者：

Lin, Ye ^{[1
]}

Jiang, Anying ^{[1
]}

Lv, Jingjing ^{[1
]}

Du, Yuan ^{[1
,2
]}

Du, Li ^{[1
,2
]}

机构：

[1] Nanjing Univ, Sch Elect Sci & Engn, Nanjing 210023, Peoples R China

[2] Nanjing Univ, Interdisciplinary Res Ctr Future Intelligent Chips, Suzhou 215163, Peoples R China

来源：

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS | 2024年 / 71卷 / 11期

关键词：

Charge-trap transistors (CTTs); offset-cancellation (OC); differential threshold voltage (Delta Vth); asynchronous programming; MEMORY; CMOS;

D O I：

10.1109/TCSII.2024.3443421

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this brief, a novel offset-cancellation (OC) technique is proposed, utilizing differential pair Charge-Trap Transistors (CTTs) to cancel offset voltage (VOS). The threshold voltage (Vth) degradation of programmed CTTs is characterized and modeled in TSMC 22-nm technology. By utilizing the Vth degradation model of CTTs, an asynchronous programming scheme is proposed to selectively program one of the CTTs based on the differential Vth ( $\Delta $ Vth) in each programming (PRG) operation of the differential pair CTTs. The experiment shows that the $\Delta $ Vth effectively reduces to less than 1mV, and displays negligible retention loss at 27 degrees C and 85 degrees C based on the differential pair CTTs and asynchronous programming scheme.

引用

页码：4638 / 4642

页数：5