Effects of Cu ion implantation on the microstructure, dielectric and impedance properties of SrTiO3 ceramics prepared by reduction-reoxidation method

被引:2
|
作者
Bai, Wei [1 ]
Zhou, Yi [1 ]
Xiao, Menghang [1 ]
Xu, Lingfang [2 ]
Xiao, Haibo [2 ]
Tong, Yang [1 ,2 ]
He, Chuangchuang [3 ]
Pang, Jinbiao [3 ]
Xie, Qiang [3 ]
Yang, Changping [1 ,2 ]
机构
[1] Taiyuan Univ Sci & Technol, Sch Mat Sci & Engn, Taiyuan 030024, Peoples R China
[2] Hubei Univ, Fac Phys & Elect Sci, Wuhan 430062, Peoples R China
[3] China Zhenhua Elect Grp Co Ltd, Guiyang 550018, Peoples R China
基金
中国国家自然科学基金;
关键词
Ion implantation; Colossal permittivity; Dielectric properties; IBLC effect; SrTiO3; ceramics; COLOSSAL PERMITTIVITY; GRAIN-BOUNDARIES; NB; TEMPERATURE; STABILITY;
D O I
10.1016/j.ceramint.2024.08.470
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
SrTiO3 ceramic samples were successfully prepared using an innovative approach that combined ion implantation technique with the reductive-reoxidation sintering method. SrTiO3 ceramics were reductively sintered in N2 and H2 atmosphere, and Cu ion implanted, followed by thermal oxidation treatment in air. Experimental results demonstrate a notable reduction in dielectric loss while achieving a colossal permittivity (epsilon = 41,444 at kHz, tans = 0.054 at 1 kHz). The phase structure, micromorphology, element valence state, dielectric properties and AC impedance spectrum characteristics of SrTiO3 ceramic materials were studied, and the mechanism of dielectric properties was explained using the Internal Barrier Layer Capacitor (IBLC) effects. Research results show that Cu ion implantation, oxygen vacancies at ceramic grain boundaries, and oxygen adsorption during reoxidation thermal treatment play a key role in reducing the dielectric loss of the material.
引用
收藏
页码:46279 / 46287
页数:9
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