An Overview of Noise-Shaping SAR ADC: From Fundamentals to the Frontier

被引:38
作者
Jie, Lu [1 ,2 ]
Tang, Xiyuan [3 ]
Liu, Jiaxin [4 ]
Shen, Linxiao [3 ]
Li, Shaolan [5 ]
Sun, Nan [1 ]
Flynn, Michael P. [2 ]
机构
[1] Department of Electronic Engineering, Tsinghua University, Beijing
[2] Department of Electrical and Computer Engineering, University of Michigan at Ann Arbor, Ann Arbor, 48109, MI
[3] Institute of Microelectronics, Peking University, Beijing
[4] Institute of Integrated Circuits and Systems, University of Electronic Science and Technology of China, Chengdu
[5] Department of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, 30332, GA
来源
IEEE Open Journal of the Solid-State Circuits Society | 2021年 / 1卷
关键词
ADC; DSM; Noise-shaping; oversampling; SAR; successive approximation;
D O I
10.1109/OJSSCS.2021.3119910
中图分类号
学科分类号
摘要
The Noise-Shaping (NS) SAR is an attractive new ADC architecture that emerged in the last decade. It combines the advantages of the SAR and the DSM architectures. NS SAR shows excellent potential for high efficiency and low cost, and is highly suited to process scaling. This paper gives an overview of the history of NS-SAR, reviews the fundamentals challenges, and summarizes the latest developments, including advanced loop filtering techniques, DAC mismatch mitigation, kT/C mitigation, and bandwidth boosting. A comprehensive comparison of the state-of-the-art NS-SAR ADCs is provided, and conclusions are derived. © 2021 IEEE.
引用
收藏
页码:149 / 161
页数:12
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