Andreev Reflection in the Quantum Hall Regime at an Al/InAs Junction on a Cleaved Edge

被引:0
作者
Akiho, Takafumi [1 ]
Irie, Hiroshi [1 ]
Nakazawa, Yusuke [1 ]
Sasaki, Satoshi [1 ]
Kumada, Norio [1 ]
Muraki, Koji [1 ]
机构
[1] NTT Basic Res Labs, Atsugi 2430198, Japan
关键词
Quantum Hall effect; Superconductivity; Andreevreflection; Cleaved edge overgrowth; CONDUCTIVITY; TRANSITION;
D O I
10.1021/acs.nanolett.4c04223
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
We have fabricated a superconductor/semiconductor junction composed of Al and InAs using cleaved edge overgrowth. By exploiting the unique geometry with a thin Al/Pt/Al trilayer formed on the side surface of an in situ cleaved InAs quantum well heterostructure wafer, we achieve a superconducting critical field of similar to 5 T, allowing superconductivity and quantum Hall (QH) effects to coexist down to filling factor nu = 3. Andreev reflection at zero magnetic field shows a conductance enhancement limited solely by the Fermi velocity mismatch, demonstrating a virtually barrier-free junction. Bias spectroscopy in the QH regime reveals the opening of a superconducting gap, with the reduced downstream resistance indicating electron-hole Andreev conversion. Our results, obtained in a new experimental regime characterized by a clean edge-contacted junction with a superconducting electrode narrower than the coherence length, open new avenues for both theoretical and experimental studies of the interplay between superconductivity and QH effects.
引用
收藏
页码:14790 / 14796
页数:7
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