共 29 条
[3]
basicsemi, 2024, BASiC Semiconductor B2M032120Y SiC MOSFET
[7]
Local Interconnection Degradation of a Double-Sided Cooling SiC MOSFET Module Under Power Cycling
[J].
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY,
2024, 14 (05)
:832-840