Precise Wavelength Measurement of 543-nm Frequency Stabilized He-Ne Laser Using Optical Frequency Comb

被引：0

作者：

Qiuye, Yu ^{[1
,2
]}

Jianbo, Wang ^{[2
]}

Cong, Yin ^{[2
]}

Wenwen, Bi ^{[2
]}

Lihua, Lei ^{[3
]}

Baowu, Zhang ^{[1
]}

Ming, Kong ^{[1
]}

机构：

[1] College of Metrology & Measurement Engineering, China Jiliang University, Zhejiang, Hangzhou,310018, China

[2] National Institute of Metrology, Beijing,100029, China

[3] Shanghai Institute of Measurement and Testing Technology, Shanghai,201203, China

来源：

Zhongguo Jiguang/Chinese Journal of Lasers | 2024年 / 51卷 / 13期

关键词：

713.5 Other Electronic Circuits - 716.1 Information Theory and Signal Processing - 741.3 Optical Devices and Systems - 744.4 Laser Components - 961 Systems Science;

D O I：

10.3788/CJL231097

中图分类号：

学科分类号：

摘要：

引用