Sol-Gel Spin Coating Synthesis and Characterization of Cadmium Zinc Phosphate Thin Films: Structural, Optical, and Electrical Properties

This study successfully implemented the sol-gel and spin coating technique to grow cadmium zinc phosphate cadmium zinc phosphate (CZP) thin films on a glass substrate and p-Si wafer. Structural and morphological analyses were conducted via X-ray diffraction (XRD) and field-emission scanning electron microscopy (SEM). Additionally, the films' linear and nonlinear optical properties, encompassing absorbance performance, energy gap, refractive index, dielectric, conductivity, and electronegativity, were systematically studied through UV-vis spectroscopy. XRD analysis uncovers the zinc ions substitution by cadmium ions in zinc phosphate's unit cell, generating oxygen vacancies crucial for maintaining charge neutrality. SEM images then showcase the intricate and organized nano CZP framework. Shifting to optical studies, CZP film analysis spanning 190-2500 nm reveals an indirect energy band gap of 2.92 eV. Transitioning to electrical characteristics, the CZP/p-Si junction undergoes dark mode I-V-T analysis, elucidating the ideality factor, series resistance, and barrier height.