An Enhanced Software Reliability Growth Model Considering Dynamic Fault Removal Efficiency and Residual Error Change Rate

被引:1
作者
Samal, Umashankar [1 ]
Kumar, Ajay [1 ]
机构
[1] Atal Bihari Vajpayee Indian Inst Informat Technol, Dept Engn Sci, Gwalior 474015, India
关键词
software reliability growth model; non-homogeneous poisson process; fault removal efficiency; mean value function; residual error;
D O I
10.6688/JISE.20241140(6).0010
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
In our fast-paced modern world, software systems have become indispensable in both personal and professional spheres. With increasing reliance on software products, the demand for reliable and high-quality software has intensified, placing significant pressure on developers to stay competitive. Software reliability growth models (SRGMs) play a vital role in assessing the dependability of software systems during their development. These models mathematically analyze the relationship between detected faults, testing time, and failures, enabling the prediction of software failures. This paper introduces an approach to software reliability evaluation, considering the dynamic nature of fault removal efficiency (FRE) during development. Additionally, the model accounts for the change rate of residual errors, considering both error introduction and correction processes. Moreover, the adoption of S-shaped curves captures the learning process of software developers, enhancing the model's accuracy. This approach guides software developers to make informed decisions, leading to improved software reliability and performance, meeting escalating demands.
引用
收藏
页码:1321 / 1333
页数:13
相关论文
共 23 条