Investigations of crystallization kinetics of Se 82-x Te 18 Sb x (x =0, 4, 8, 12) glassy alloys by iso-conversional approach

被引：7
|
作者：
Rao V. [1 ]
Mehta N. [2 ]
Dwivedi D.K. [1 ]
机构：
[1] Amorphous Semiconductor Research Lab, Department of Applied Science, Madan Mohan Malaviya University of Technology, Gorakhpur
[2] Department of Physics, Institute of Science, Banaras Hindu University, Varanasi
来源：
Materials Research Innovations | 2019年 / 23卷 / 03期
关键词：
activation energy; Avrami exponent; Crystallization kinetics; differential scanning calorimetry; rate of crystallization;
D O I：
10.1080/14328917.2017.1401389
中图分类号：
学科分类号：
摘要：
At different heating rates, the crystallization temperature (T c ) are obtained from the non-isothermal differential scanning calorimetry (DSC) measurements of bulk Se 82–x Te 18 Sb x (x = 0, 4, 8 and 12) chalcogenide glasses prepared by melt quench technique. It was observed that the crystallization temperatures increase with increasing heating rates and also by increasing Sb concentration in Se–Te system. The activation energy of crystallization (E c ), the Avrami exponent (n) and rate of crystallization (K p ) have been determined from the different models. Glassy nature of as prepared samples has been confirmed using DSC techniques. © 2017, © 2017 Informa UK Limited, trading as Taylor & Francis Group.
引用
收藏
页码：141 / 148
页数：7
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