Shape control of trenched 4H-SiC C-face by thermal chlorine etching

被引:0
|
作者
Graduate School of Materials Science, Nara Institute of Science and Technology, Ikoma, Nara 630-0192, Japan [1 ]
机构
来源
Jpn. J. Appl. Phys. | 1600年 / 5 PART 1卷
关键词
Number:; 23560367; Acronym: [!text type='JS']JS[!/text]PS; Sponsor: Japan Society for the Promotion of Science;
D O I
暂无
中图分类号
学科分类号
摘要
Etching
引用
收藏
相关论文
共 50 条
  • [1] Shape Control of Trenched 4H-SiC C-Face by Thermal Chlorine Etching
    Koketsu, Hidenori
    Hatayama, Tomoaki
    Yano, Hiroshi
    Fuyuki, Takashi
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2012, 51 (05)
  • [2] MOS Characteristics of C-Face 4H-SiC
    Z. Chen
    A.C. Ahyi
    X. Zhu
    M. Li
    T. Isaacs-Smith
    J.R. Williams
    L.C. Feldman
    Journal of Electronic Materials, 2010, 39 : 526 - 529
  • [3] MOS Characteristics of C-Face 4H-SiC
    Chen, Z.
    Ahyi, A. C.
    Zhu, X.
    Li, M.
    Isaacs-Smith, T.
    Williams, J. R.
    Feldman, L. C.
    JOURNAL OF ELECTRONIC MATERIALS, 2010, 39 (05) : 526 - 529
  • [4] Homoepitaxial growth on a 4H-SiC C-face substrate
    Kojima, Kazutoshi
    Kuroda, Satoshi
    Okumura, Hajime
    Arai, Kazuo
    CHEMICAL VAPOR DEPOSITION, 2006, 12 (8-9) : 489 - 494
  • [5] Revelation of the dislocations in the C-face of 4H-SiC substrates using a microwave plasma etching treatment
    Yu, Jinying
    Yang, Xianglong
    Peng, Yan
    Hu, Xiaobo
    Wang, Xiwei
    Chen, Xiufang
    Xu, Xiangang
    CRYSTENGCOMM, 2021, 23 (02) : 353 - 359
  • [6] Off-Orientation Influence on C-face (0001) 4H-SiC Surface Morphology Produced by Etching using Chlorine Trifluoride Gas
    Fukumoto, Yusuke
    Habuka, Hitoshi
    Kato, Tomohisa
    SILICON CARBIDE AND RELATED MATERIALS 2013, PTS 1 AND 2, 2014, 778-780 : 734 - 737
  • [7] Off-Orientation Influence on C-Face (0001) 4H-SiC Surface Morphology Produced by Etching Using Chlorine Trifluoride Gas
    Habuka, Hitoshi
    Fukumoto, Yusuke
    Kato, Tomohisa
    ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY, 2013, 2 (08) : N3025 - N3027
  • [8] 4H-SiC Epitaxial Growth on C-face 150 mm SiC Substrate
    Miyasaka, Akira
    Norimatsu, Jun
    Fukada, Keisuke
    Tajima, Yutaka
    Kageshima, Yoshiaki
    Muto, Daisuke
    Odawara, Michiya
    Okano, Taichi
    Momose, Kenji
    Osawa, Yuji
    Osawa, Hiroshi
    Sato, Takayuki
    SILICON CARBIDE AND RELATED MATERIALS 2013, PTS 1 AND 2, 2014, 778-780 : 193 - 196
  • [9] Comparison of dislocation behavior in Si- and C-face 4H-SiC
    Chen, Bin
    Matsuhata, Hirofumi
    Sekiguchi, Takashi
    Ohyanagi, Takasumi
    Kinoshita, Akimasa
    Okumura, Hajime
    PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 8, NO 4, 2011, 8 (04): : 1278 - 1281
  • [10] Fabrication of p-channel MOSFETs on 4H-SiC C-face
    Okamoto, Mitsuo
    Iijima, Miwako
    Yatsuo, Tsutomu
    Nagano, Takahiro
    Fukuda, Kenji
    Okumura, Hajime
    SILICON CARBIDE AND RELATED MATERIALS 2010, 2011, 679-680 : 653 - 656