Interfacial IMC layer morphology and growth behavior of Sn3.0Ag0.5Cu0.05Cr/Cu solder joints during isothermal aging

被引：0

作者：

Xie, Shifang ^{[1
]}

Wei, Xicheng ^{[2
]}

Ju, Guokui ^{[2
]}

Xu, Kexin ^{[2
]}

机构：

[1] Institute of Applied Physics, Jiangxi Academy of Sciences, Nanchang,330029, China

[2] Shanghai University, Shanghai,200072, China

来源：

Xiyou Jinshu Cailiao Yu Gongcheng/Rare Metal Materials and Engineering | 2015年 / 44卷 / 09期

关键词：

Thermal aging;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

The morphology and growth behavior of interfacial intermetallic compound (IMC) layer for the Sn3.0Ag0.5Cu0.05Cr (SACCr)/Cu joints after isothermal aging at 150℃ for 0, 168, 500 and 1000 h were investigated, and they were compared with Sn3.0Ag0.5Cu (SAC). The results show that the trace Cr dispersed or dissolved in SAC solder effectively inhibits the IMC layer growth at the interface of SACCr/Cu joints. The longer the aging time, the more obvious the inhibiting effect of Cr on the overgrowth of IMC layer of solder/Cu joints. The average thickness of IMC layer of SACCr/Cu solder joints is about 5.13 μm after aging for 1000 h, only 45% of that of the SAC/Cu solder joints. ©, 2015, Rare Metals Materials and Engineering Press. All right reserved.

引用

页码：2234 / 2239