Measurement of local barrier height on the reconstructed Au (111) surface

被引：0

作者：

Yagyu, Shinjiro ^{[1
]}

Yoshitake, Michiko ^{[1
]}

机构：

[1] Nanomaterials Laboratory, National Institute for Materials Science, 3-13, Sakura, Tsukuba, Ibaraki 305-0003, Japan

来源：

Shinku/Journal of the Vacuum Society of Japan | 2002年 / 45卷 / 12期

关键词：

Bias voltage - Electric power distribution - Iridium - Platinum - Scanning tunneling microscopy;

D O I：

10.3131/jvsj.45.862

中图分类号：

学科分类号：

摘要：

The bias voltage dependence of the apparent local barrier height (LBH) corresponding to work function at nanometer-scale has been measured by scanning tunnel microscope (STM) on the reconstructed Au(111) surface with Pt-Ir and Au tips at a low bias voltage from ±50 to ±400 mV. The LBH value measured under a constant-current condition increases with increasing absolute bias voltage. Under a constant current condition, increase of the absolute bias voltage causes increase of the tip-sample separation. Therefore, the result is due to the separation effects rather than bias voltage effects.

引用

页码：862 / 865