Optimization of configurable greedy algorithm for covering arrays generation

被引:0
作者
State Key Laboratory for Novel Software Technology , Nanjing 210093, China [1 ]
不详 [2 ]
机构
[1] State Key Laboratory for Novel Software Technology (Nanjing University)
[2] China Electric Power Research Institute
来源
Nie, C.-H. (changhainie@nju.edu.cn) | 1600年 / Chinese Academy of Sciences卷 / 24期
关键词
Combinatorial testing; Covering array; Greedy algorithm; Software testing; Test case generation;
D O I
10.3724/SP.J.1001.2013.04326
中图分类号
学科分类号
摘要
Covering an array generation is one of the key issues in combinatorial testing, and algorithms are popular due to its ability to deliver smaller covering array in shorter time. People have proposed many greedy algorithms based on different strategies, and most of these can be integrated into a framework, which forms a configurable greedy algorithm. Many new algorithms can be developed within this framework, however, deploying and optimizing the framework affected by multiple factors to construct more efficient covering arrays is a new challenge. The paper designs three different experiments under the framework with six decisions, systematically explore the influence of each of the decisions and interactions among them, to find the best configuration for generating smaller covering array, and provide theoretical and practical guideline for the design and optimization of greedy algorithms. © 2013 ISCAS.
引用
收藏
页码:1469 / 1483
页数:14
相关论文
共 17 条
  • [1] Nie C.H., Leung H., A survey of combinatorial testing, ACM Computing Survey, 43, 2, pp. 1-29, (2011)
  • [2] Kuhn D., Reilly M., An investigation of the applicability of design of experiments to software testing, Proc. of the 27th Annual NASA Goddard/IEEE Software Engineering Workshop, pp. 1-5, (2002)
  • [3] Grindal M., Offutt A.J., Andler S.F., Combination testing strategies: A survey, Software Testing, Verification, and Reliability, 15, 3, pp. 167-199, (2005)
  • [4] Grindal M., Lindstrom B., Offutt A.J., Andler S.F., An evaluation of combination strategies for test case selection, Empirical Software Engineering, 11, pp. 583-611, (2006)
  • [5] Yan J., Zhang J., Combinatorial testing: Principle and methods, Ruan Jian Xue Bao/Journal of Software, 20, 6, pp. 1393-1405, (2009)
  • [6] Williams A.W., Prober R.L., A practical strategy for testing pair-wise coverage of network interfaces, Proc. of the 7th Int'l Symp. on Software Reliability Engineering (ISSRE'96), pp. 246-254, (1997)
  • [7] Nurmela K.J., Upper bounds for covering arrays by tabu search, Discrete Applied Mathematics, 138, 1-2, pp. 143-152, (2004)
  • [8] Cohen M.B., Gibbons P.B., Mugridge W.B., Colbourn C.J., Constructing test suites for interaction testing, Proc. of the 25th Int'l Conf. on Software Engineering (ICSE 2003), pp. 38-48, (2003)
  • [9] Cohen D.M., Dalal S.R., Fredman M.L., Patton G.C., The AETG system: An approach to testing based on combinatorial design, IEEE Trans. on Software Engineering, 23, 7, pp. 437-444, (1997)
  • [10] Cohen D.M., Dalal S.R., Kajla A., Patton G.C., The automatic efficient tests generator (AETG) system, Proc. of the 5th IEEE Int'l Symp. on Software Reliability Engineering, pp. 303-309, (1994)