Contact potential measurements with a local Kelvin probe

被引:0
作者
Hadjadj, Aomar
Equer, B.
Beorchia, A.
Roca, i Cabarrocas, P.
机构
[1] U. Mixte de Rech. associee CNRS 6107, Faculté des Sciences, Moulin de la Housse, BP 1039, 51687 Reims Cedex 2, France
[2] Laboratoire de PICM, U. Mixte de Rech. associee CNRS 7647, Ecole Polytechnique, 91128 Palaiseau Cedex, France
来源
Philosophical Magazine B: Physics of Condensed Matter; Statistical Mechanics, Electronic, Optical and Magnetic Properties | 2002年 / 82卷 / 11期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
35
引用
收藏
页码:1257 / 1266
相关论文
共 50 条
[41]   Local work function measurements on various inorganic materials using Kelvin probe force spectroscopy [J].
Kim, Chanhyung ;
Bae, Changdeuck ;
Ryu, Kyunghee ;
Lee, Bongki ;
Shin, Hyunjung .
ADVANCES IN NANOMATERIALS AND PROCESSING, PTS 1 AND 2, 2007, 124-126 :607-+
[42]   Applying Second and Third Resonance Frequencies to Surface Potential Measurements with Kelvin Probe Force Microscopy [J].
Honda, Akinori ;
Itoh, Hiroshi .
E-JOURNAL OF SURFACE SCIENCE AND NANOTECHNOLOGY, 2018, 16 :339-342
[43]   A micromachined Kelvin probe for surface potential measurements in microfluidic channels and solid-state applications [J].
Chu, LL ;
Takahata, K ;
Selvaganapathy, P ;
Shohet, JL ;
Gianchandani, YB .
BOSTON TRANSDUCERS'03: DIGEST OF TECHNICAL PAPERS, VOLS 1 AND 2, 2003, :384-387
[44]   Measurements of potential barrier height of grain boundaries in polycrystalline silicon by Kelvin probe force microscopy [J].
Tsurekawa, S ;
Kido, K ;
Watanabe, T .
PHILOSOPHICAL MAGAZINE LETTERS, 2005, 85 (01) :41-49
[45]   Quantitative measurement of the local surface potential of π-conjugated nanostructures:: A Kelvin probe force microscopy study [J].
Liscio, Andrea ;
Palermo, Vincenzo ;
Gentilini, Desiree ;
Nolde, Fabian ;
Muellen, Klaus ;
Samori, Paolo .
ADVANCED FUNCTIONAL MATERIALS, 2006, 16 (11) :1407-1416
[46]   Local Surface Potential of π-Conjugated Nanostructures by Kelvin Probe Force Microscopy: Effect of the Sampling Depth [J].
Liscio, Andrea ;
Palermo, Vincenzo ;
Fenwick, Oliver ;
Braun, Slawomir ;
Muellen, Klaus ;
Fahlman, Mats ;
Cacialli, Franco ;
Samori, Paolo .
SMALL, 2011, 7 (05) :634-639
[47]   MEASUREMENTS OF CONTACT POTENTIAL BETWEEN AN EMITTING ELECTRODE AND A PROBE WITHIN A PLASMA [J].
AMEMIYA, H ;
WIESEMANN, K .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1972, 5 (10) :1829-+
[48]   Kelvin Probe Measurements of p-type GaN [J].
Foussekis, M. ;
Ni, X. ;
Morkoc, H. ;
Reshchikov, M. A. ;
Baski, A. A. .
GALLIUM NITRIDE MATERIALS AND DEVICES VI, 2011, 7939
[49]   Space Charge Measurements with Kelvin Probe Force Microscopy [J].
Faliya, Kapil ;
Kliem, Herbert ;
Dias, Carlos J. .
IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, 2017, 24 (03) :1913-1922
[50]   The role of the cantilever in Kelvin probe force microscopy measurements [J].
Elias, George ;
Glatzel, Thilo ;
Meyer, Ernst ;
Schwarzman, Alex ;
Boag, Amir ;
Rosenwaks, Yossi .
BEILSTEIN JOURNAL OF NANOTECHNOLOGY, 2011, 2 :252-260