Contact potential measurements with a local Kelvin probe

被引：0
|
作者：
Hadjadj, Aomar
Equer, B.
Beorchia, A.
Roca, i Cabarrocas, P.
机构：
[1] U. Mixte de Rech. associee CNRS 6107, Faculté des Sciences, Moulin de la Housse, BP 1039, 51687 Reims Cedex 2, France
[2] Laboratoire de PICM, U. Mixte de Rech. associee CNRS 7647, Ecole Polytechnique, 91128 Palaiseau Cedex, France
来源：
Philosophical Magazine B: Physics of Condensed Matter; Statistical Mechanics, Electronic, Optical and Magnetic Properties | 2002年 / 82卷 / 11期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
35
引用
收藏
页码：1257 / 1266
相关论文
共 50 条
  • [1] Contact potential measurements with a local Kelvin probe
    Hadjadj, A
    Equer, B
    Beorchia, A
    Cabarrocas, PRI
    PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 2002, 82 (11): : 1257 - 1266
  • [2] INVESTIGATION OF THE CONTACT POTENTIAL OF THE HEAD-DISK INTERFACE USING KELVIN PROBE MEASUREMENTS
    Trinh, Tan D.
    Spada, Frederick E.
    Ovcharenko, Andrey
    Talke, Frank E.
    PROCEEDINGS OF THE ASME/JSME JOINT INTERNATIONAL CONFERENCE ON INFORMATION STORAGE AND PROCESSING SYSTEMS AND MICROMECHATRONICS FOR INFORMATION AND PRECISION EQUIPMENT, 2018, 2018,
  • [3] CONTACT POTENTIAL DIFFERENCE MEASUREMENTS BY THE KELVIN METHOD
    RIVIERE, JC
    PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1957, 70 (07): : 676 - 686
  • [4] Local surface potential measurements of carbon nanotube FETs by Kelvin probe force microscopy
    Miyato, Yuji
    Kobayashi, Kei
    Matsushige, Kazumi
    Yamada, Hirofumi
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2005, 44 (4 A): : 1633 - 1636
  • [5] CONTACT POTENTIAL DIFFERENCE MEASUREMENTS BY THE KELVIN METHOD
    FARNSWORTH, HE
    PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1958, 71 (460): : 703 - 704
  • [6] Local surface potential measurements of carbon nanotube FETs by Kelvin probe force microscopy
    Miyato, Y
    Kobayashi, K
    Matsushige, K
    Yamada, H
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2005, 44 (4A): : 1633 - 1636
  • [7] High-resolution scanning Kelvin probe microscope for contact potential measurements on the 100 nm scale
    Review of Scientific Instruments, 1997, 68 (08):
  • [8] PIEZOELECTRIC DRIVEN KELVIN PROBE FOR CONTACT POTENTIAL DIFFERENCE STUDIES
    BESOCKE, K
    BERGER, S
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1976, 47 (07): : 840 - 842
  • [9] MICRO KELVIN PROBE FOR LOCAL WORK-FUNCTION MEASUREMENTS
    BAUMGARTNER, H
    LIESS, HD
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1988, 59 (05): : 802 - 805
  • [10] DETERMINATION OF CONTACT POTENTIAL DIFFERENCE BY THE KELVIN PROBE (PART I) I. BASIC PRINCIPLES OF MEASUREMENTS
    Vilitis, O.
    Rutkis, M.
    Busenberg, J.
    Merkulov, D.
    LATVIAN JOURNAL OF PHYSICS AND TECHNICAL SCIENCES, 2016, 53 (02) : 48 - 57
12345