Study on pulsed laser hetero-epitaxial growth and properties of Pb(Zr0.52Ti0.48)O3 film

被引：0
|
作者：
Liu, Yu [1 ,2 ]
Cheng, Xiu-Lan [1 ]
Xie, Si-Qiang [3 ]
机构：
[1] School of Microelectronics, Shanghai Jiaotong University, Shanghai 200030, China
[2] Semiconductor Manufacture International Corporation (Shanghai) FAB3, Shanghai 201203, China
[3] School of Electronic Eng., University of Electronic Science and Technology of China, Chengdu 610054, China
来源：
Gongneng Cailiao/Journal of Functional Materials | 2007年 / 38卷 / 05期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：734 / 736
相关论文
共 50 条
  • [1] Growth model of epitaxial Pb(Zr0.52Ti0.48)O3 nanoislands
    Chu, MW
    Szafraniak, I
    Scholz, R
    Hesse, D
    Alexe, M
    Gösele, U
    FERROELECTRIC THIN FILMS XII, 2004, 784 : 9 - 12
  • [2] Coercive field of ultrathin Pb(Zr0.52Ti0.48)O3 epitaxial films
    Pertsev, NA
    Contreras, JR
    Kukhar, VG
    Hermanns, B
    Kohlstedt, H
    Waser, R
    APPLIED PHYSICS LETTERS, 2003, 83 (16) : 3356 - 3358
  • [3] Ferroelectric properties of the flexible Pb(Zr0.52Ti0.48)O3 thin film on mica
    Qi, Hongyan
    Xia, Xin
    Zhou, Changlin
    Xiao, Pengcheng
    Wang, Yun
    Deng, Yongju
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2020, 31 (04) : 3042 - 3047
  • [4] Ferroelectric properties of the flexible Pb(Zr0.52Ti0.48)O3 thin film on mica
    Hongyan Qi
    Xin Xia
    Changlin Zhou
    Pengcheng Xiao
    Yun Wang
    Yongju Deng
    Journal of Materials Science: Materials in Electronics, 2020, 31 : 3042 - 3047
  • [5] Stress-controlled Pb(Zr0.52Ti0.48)O3 thick films by thermal expansion mismatch between substrate and Pb(Zr0.52Ti0.48)O3 film
    Han, Guifang
    Ryu, Jungho
    Yoon, Woon-Ha
    Choi, Jong-Jin
    Hahn, Byung-Dong
    Kim, Jong-Woo
    Park, Dong-Soo
    Ahn, Cheol-Woo
    Priya, Shashank
    Jeong, Dae-Yong
    JOURNAL OF APPLIED PHYSICS, 2011, 110 (12)
  • [6] Thickness dependence of Pb(Zr0.52Ti0.48)O3 films prepared by pulsed laser deposition
    Kim, MC
    Choi, JW
    Yoon, SJ
    Yoon, KH
    Kim, HJ
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2002, 41 (6A): : 3817 - 3821
  • [7] Effect of LaNiO3 interlayer on electrical properties of Pb(Zr0.52Ti0.48)O3/LaNiO3/Pb(Zr0.52Ti0.48)O3 composite films
    Zhang, Fan
    Lv, Yang
    Shao, Yan
    Bai, Yu
    Li, Yi Zhuo
    Wang, Chao
    Wang, Zhan Jie
    VACUUM, 2021, 189
  • [8] Preparation and study on epitaxial Pb(Zr0.52Ti0.48)O3 ferroelectric films on different substrates
    Li, JK
    Yao, X
    ACTA PHYSICA SINICA, 2005, 54 (06) : 2938 - 2944
  • [9] Pizeoelectric epitaxial sol-gel Pb(Zr0.52Ti0.48)O3 film on Si(001)
    Yin, S.
    Le Rhun, G.
    Defay, E.
    Vilquin, B.
    Niu, G.
    Robach, Y.
    Dragoi, C.
    Trupina, L.
    Pintilie, L.
    2012 INTERNATIONAL SYMPOSIUM ON APPLICATIONS OF FERROELECTRICS HELD JOINTLY WITH 11TH IEEE ECAPD AND IEEE PFM (ISAF/ECAPD/PFM), 2012,
  • [10] Optical Studies of Pulsed Laser Deposited Nanostructured Pb(Zr0.52Ti0.48)O3 Thin Film by Spectroscopic Ellipsometry
    Prabu, M.
    Banu, I. B. Shameem
    Sundari, S. Tiripura
    Krishnan, R.
    Prakash, K. Niranjan
    Chen, Y. C.
    Chavali, Murthy
    JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2014, 14 (07) : 5335 - 5341
12345