Measurement techniques of liquid molecular diffusivity by holographic interferometry

被引：0
作者：
Ma, Youguang
Zhu, Chunying
Xu, Shichang
Yu, Guocong
机构：
来源：
Yingyong Jiguang/Applied Laser Technology | 2003年 / 23卷 / 06期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [31] Measurement of thermal diffusivity of air using photopyroelectric interferometry
    Wang, C
    Mandelis, A
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1999, 70 (05) : 2372 - 2378
  • [32] HOLOGRAPHIC INTERFEROMETRY - MEASUREMENT OF IN-PLANE DEFORMATION
    MOHAN, VR
    RAO, VV
    CURRENT SCIENCE, 1974, 43 (06): : 174 - 174
  • [33] APPLICATION OF HOLOGRAPHIC INTERFEROMETRY TO MEASUREMENT OF POISSONS RATIO
    YAMAGUCHI, I
    SAITO, H
    JAPANESE JOURNAL OF APPLIED PHYSICS, 1969, 8 (06) : 768 - +
  • [34] Measurement of thermal diffusivity of air using photopyroelectric interferometry
    Wang, Chinhua
    Mandelis, Andreas
    Review of Scientific Instruments, 70 (05): : 2372 - 2378
  • [35] Integrated holographic interferometry and moire interferometry for deformation measurement in electronic package
    Yang, YP
    Wang, WN
    Liu, L
    THIRD INTERNATIONAL CONFERENCE ON EXPERIMENTAL MECHANICS, 2002, 4537 : 293 - 296
  • [36] Spatially resolved holographic measurement of the thermal diffusivity in liquids
    J.R. Schwesyg
    H.A. Eggert
    J.R. Adleman
    K. Buse
    Applied Physics B, 2008, 92 : 79 - 81
  • [37] Spatially resolved holographic measurement of the thermal diffusivity in liquids
    Schwesyg, J. R.
    Eggert, H. A.
    Adleman, J. R.
    Buse, K.
    APPLIED PHYSICS B-LASERS AND OPTICS, 2008, 92 (01): : 79 - 81
  • [38] HOLOGRAPHIC MICROSCOPY IN MEASUREMENT TECHNIQUES
    LEKHTSIER, EN
    MEASUREMENT TECHNIQUES, 1978, 21 (09) : 1199 - 1204
  • [39] DIFFUSIVITY MEASUREMENT TECHNIQUES IN LIQUIDS.
    Vilker, V.L.
    AIChEMI Modular Instruction, Series C: Transport, 1983, 3 : 32 - 39
  • [40] Studying living phase objects by holographic interferometry techniques
    V. A. Babenko
    V. B. Konstantinov
    A. F. Malyĭ
    Technical Physics Letters, 2007, 33 : 353 - 354
12345