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- [6] Analysis of Bias Effects on VSWR Ruggedness in RF LDMOS for Avionics Applications 2008 EUROPEAN MICROWAVE INTEGRATED CIRCUITS CONFERENCE (EUMIC), 2008, : 28 - 31
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- [9] A Nonlinear Electro-Thermal Model for High Power RF LDMOS Transistors 2008 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-4, 2008, : 474 - 477