A wavelet threshold denoising method for fault data based on CEEMD and permutation entropy

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作者：
China Ship Development and Design Center, Wuhan [1 ]
430064, China
不详 [2 ]
430064, China
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J Vib Shock | / 23卷 / 207-211期
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D O I：
10.13465/j.cnki.jvs.2015.23.036
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