Thermal damage mechanism on CCD detector irradiated by pulsed laser

被引：0
|
作者：
Gao, Liuzheng [1 ]
Shao, Zhengzheng [1 ]
Zhu, Zhiwu [2 ]
Huang, Ren [1 ]
Chang, Shengli [1 ]
机构：
[1] College of Science, National University of Defense Technology, Hunan 410073, China
[2] College of Optoelectronic Science and Engineering, National University of Defense Technology, Hunan 410073, China
来源：
Zhongguo Jiguang/Chinese Journal of Lasers | 2013年 / 40卷 / SUPPL期
关键词：
D O I：
10.3788/CJL201340.s103002
中图分类号：
学科分类号：
摘要：
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