Determination of thickness, refractive index, and thickness irregularity for semiconductor thin films from transmission spectra

被引：1
|
作者：
Aqili, Akram K. S. [1 ]
Maqsood, Asghari [1 ]
机构：
[1] Thermal Physics Laboratory, Department of Physics, Quaid-i-Azam University, Islamabad, Pakistan
来源：
Applied Optics | 2002年 / 41卷 / 01期
关键词：
Semiconductor thin films;
D O I：
10.1364/ao.41.000218
中图分类号：
学科分类号：
摘要：
引用
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页码：218 / 224
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