Surface segregation of lead in high-purity aluminum

被引：5

作者：

机构：

[1] Tsubakino, H.

[2] Terasawa, M.

[3] Mitamura, T.

[4] Nogami, A.

[5] Sugimoto, K.

[6] Kinomura, A.

来源：

Tsubakino, H. | 2001年 / Japan Institute of Light Metals卷 / 51期

关键词：

Aluminum foil - Annealing - Rutherford backscattering spectroscopy - Segregation (metallography) - Transmission electron microscopy;

D O I：

10.2464/jilm.51.98

中图分类号：

学科分类号：

摘要：

Surface segregation of Pb in the annealed Al-foils has been studied by Rutherford back scattering spectroscopy (RBS) and transmission electron microscopy (TEM). High-purity Al-foils containing 100 mass-ppm Pb were heat-treated for 1h or 4 h at 540°C. Almost all of Pb segregate in a thin layer, 0.1 μm from the surface. Lead contents in the Pb-enriched surface layers were estimated to be 0.1∼0.14 at% Pb which were about 100-fold higher than the initial bulk concentration. TEM observations show that Pb-particles are formed at foil surfaces and their size increases from about 80 nm to 240 nm when final annealing time increases from 1 h to 4 h at 540°C. The Pb particles have a cube-cube orientation relationship with Al matrix and are bounded by {100} and {111} facets.

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