Analysis of charge accumulation at dielectric interface

被引：0
|
作者：
Wang, F. [1 ]
Xiao, D.M. [1 ]
Chen, Q.G. [1 ]
Qiu, Y.C. [1 ]
机构：
[1] Xi'an Jiaotong Univ., Xi'an 710049, China
来源：
Hsi-An Chiao Tung Ta Hsueh/Journal of Xi'an Jiaotong University | 2001年 / 35卷 / 04期
关键词：
Dielectric materials - Interfaces (materials) - Mathematical models;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The dynamic equation describing the relationship between surface charge density and voltage is established. The constants of voltage/field strength A and B are introduced. Based on the present equation, the constants A, B and the surface charge density of three typical electrodes are calculated. The dynamic process of surface charging is analyzed, and the approximate expression for the dynamic charge distribution is also presented. The result is supported by measurements reported in some previous investigations.
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页码：347 / 350
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