Analysis of charge accumulation at dielectric interface

被引：0
|
作者：
Wang, F. [1 ]
Xiao, D.M. [1 ]
Chen, Q.G. [1 ]
Qiu, Y.C. [1 ]
机构：
[1] Xi'an Jiaotong Univ., Xi'an 710049, China
来源：
Hsi-An Chiao Tung Ta Hsueh/Journal of Xi'an Jiaotong University | 2001年 / 35卷 / 04期
关键词：
Dielectric materials - Interfaces (materials) - Mathematical models;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The dynamic equation describing the relationship between surface charge density and voltage is established. The constants of voltage/field strength A and B are introduced. Based on the present equation, the constants A, B and the surface charge density of three typical electrodes are calculated. The dynamic process of surface charging is analyzed, and the approximate expression for the dynamic charge distribution is also presented. The result is supported by measurements reported in some previous investigations.
引用
收藏
页码：347 / 350
相关论文
共 50 条
  • [1] Enhanced Charge Accumulation in Activated Carbon via the Dielectric Interface
    Toyota, Yuji
    Teranishi, Takashi
    Fukui, Kosuke
    Takahashi, Masakuni
    Qiuyu, Ji
    Kondo, Shinya
    Nakayama, Masanobu
    Kishimoto, Akira
    ACS APPLIED ENERGY MATERIALS, 2024, 7 (04) : 1440 - 1447
  • [2] Dielectric Interface Effects on Surface Charge Accumulation and Collection towards High-Efficiency Organic Solar Cells
    Hsiao, Yu-Che
    Zang, Huidong
    Ivanov, Ilia
    Xu, Tao
    Lu, Luyao
    Yu, Luping
    Hu, Bin
    JOURNAL OF APPLIED PHYSICS, 2014, 115 (15)
  • [3] Dielectric interface effects on surface charge accumulation and collection towards high-efficiency organic solar cells
    Hu, B. (bhu@utk.edu), 1600, American Institute of Physics Inc. (115):
  • [4] Reliability of electrostatic MEMS: Charge accumulation in dielectric layer
    Chen, XY
    Ma, ZC
    Lee, YC
    INTERNATIONAL JOURNAL OF NONLINEAR SCIENCES AND NUMERICAL SIMULATION, 2002, 3 (3-4) : 665 - 670
  • [5] Interface Charge Characteristics in Polymer Dielectric Contacts: Analysis of Acoustic Approach and Probe Microscopy
    Hu, Leiyu
    Wang, Weiwang
    Yu, Shixin
    Ma, Diqin
    Lv, Jiaju
    Zhong, Yu
    Li, Shengtao
    Tanaka, Yasuhiro
    Takada, Tatsuo
    ADVANCED MATERIALS INTERFACES, 2023, 10 (16)
  • [6] Minimal model for charge transfer excitons at the dielectric interface
    Ono, Shota
    Ohno, Kaoru
    PHYSICAL REVIEW B, 2016, 93 (12)
  • [7] Dielectric interface characterization by means of space charge measurements
    Bodega, R
    Morshuis, PHF
    Redjosentono, E
    Smit, JJ
    2003 ANNUAL REPORT CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA, 2003, : 728 - 733
  • [8] CHARGE ACCUMULATION AND MOBILITY IN THIN DIELECTRIC MOS-TRANSISTORS
    SODINI, CG
    EKSTEDT, TW
    MOLL, JL
    SOLID-STATE ELECTRONICS, 1982, 25 (09) : 833 - 841
  • [9] TRANSIENT ACCUMULATION OF INTERFACIAL CHARGE IN PHOTOCONDUCTOR-DIELECTRIC SYSTEMS
    MORT, J
    NIELSEN, P
    PHYSICAL REVIEW B-SOLID STATE, 1972, 5 (08): : 3336 - +
  • [10] Effects of charge accumulation in a dielectric covered electrode system in air
    Chalmers Univ of Technology, Goteborg, Sweden
    Doktorsavhandlingar vid Chalmers Tekniska Hogskola, 2000, (1621): : 113 - 118
12345