共 50 条
- [1] Journal of Electronic Testing: Theory Applications (JETTA): EditorialJournal of Electronic Testing: Theory and Applications (JETTA), 2008, 24 (04):Agrawal, Vishwani D.
- [2] Journal of Electronic Testing: Theory and Applications (JETTA): EditorialJournal of Electronic Testing: Theory and Applications (JETTA), 2009, 25 (06):Agrawal, Vishwani D.
- [3] Journal of Electronic Testing: Theory and Applications (JETTA): EditorialJournal of Electronic Testing: Theory and Applications (JETTA), 2005, 21 (05):Agrawal, Vishwani D.
- [4] Journal of Electronic Testing: Theory and Applications (JETTA): EditorialJ Electron Test Theory Appl JETTA, 2007, 6 (469):UFRGS Federal University, Porto Alegre, Brazil不详不详
- [5] Journal of Electronic Testing: Theory and Applications (JETTA): EditorialJournal of Electronic Testing: Theory and Applications (JETTA), 2010, 26 (04):Agrawal, Vishwani D.
- [6] Journal of Electronic Testing: Theory and Applications (JETTA): EditorialJournal of Electronic Testing: Theory and Applications (JETTA), 2011, 27 (01): : 1 - 2Agrawal, Vishwani D.
- [7] Journal of Electronic Testing: Theory and Applications (JETTA): EditorialJournal of Electronic Testing: Theory and Applications (JETTA), 2010, 26 (03):Agrawal, Vishwani D.
- [8] Journal of Electronic Testing: Theory and Applications (JETTA): EditorialJournal of Electronic Testing: Theory and Applications (JETTA), 2010, 26 (02):Agrawal, V.D.
- [9] Journal of Electronic Testing: Theory and Applications (JETTA): EditorialJournal of Electronic Testing: Theory and Applications (JETTA), 2007, 23 (05):Agrawal, Vishwani D.
- [10] Journal of Electronic Testing Theory and Applications (JETTA): Editorial J Electron Test Theory Appl JETTA, 2008, 1-3 (01):