Scanning Kelvin Probe Force Microscopy: Working Principle and Application in the Research of Materials Corrosion

被引：0
作者：
Song B. [1 ]
Chen X. [1 ]
机构：
[1] College of Petroleum Engineering, Liaoning Shihua University, Fushun
来源：
Cailiao Daobao/Materials Review | 2018年 / 32卷 / 04期
关键词：
Atomic force microscopy; Corrosion; Scanning Kelvin probe force microscopy; Volta potential difference; Working principle;
D O I：
10.11896/j.issn.1005-023X.2018.07.016
中图分类号：
学科分类号：
摘要：
Scanning Kelvin probe force microscopy (SPFKM) is a material measuring and characterizing technique which applies scanning Kelvin probe on the basis of atomic force microscopy (AFM) and has been gaining momentum in recent years. It involves simultaneously the nanometer-level topography measurement and the in-situ high-resolution volta potential mapping, thereby providing a novel insight in investigating the mechanisms of materials' corrosion behaviours. The present paper sketches out the principles with respect to the two working modes of SKPFM, summarizes the unresolved issues that have emerged in SPFKM's application, and also renders a comparative discussion between SKPFM and the traditional SKP technique. The review offers an elaborate delineation about the application of SKPFM in corrosion science, and ends with a rough description of the opportunities and challenges. © 2018, Materials Review Magazine. All right reserved.
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页码：1151 / 1157
页数：6
相关论文
共 52 条
  • [1] Binnig G., Rohrer H., Scanning tunneling microscopy, Helvetica Physica Acta, 55, (1982)
  • [2] Binnig G., Quate C.F., Gerber C.H., Et al., Atomic force microscope, Physical Review Letters, 56, (1986)
  • [3] Baykara M.Z., Schwarz U.D., Atomic force microscopy: Methods and applications, Encyclopedia of Spectroscopy and Spectrometry, (2017)
  • [4] Nonnenmacher M., O'Boyle M.P., Wickramasinghe H.K., Kelvin probe force microscopy, Applied Physical Letters, 58, (1991)
  • [5] Kelvin L.V., Contact electricity of metals, The London, Edinburgh, Dublin Philosophical Magazine and Journal of Science, 46, (1898)
  • [6] Zisman W.A., A new method of measuring contact potential, Review of Scientific Instruments, 3, (1932)
  • [7] Schmutz P., Frankel G.S., Characterization of AA2024-T3 by scanning kelvin probe force microscopy, Journal of The Electrochemical Society, 145, (1998)
  • [8] Schmutz P., Frankel G.S., Corrosion study of AA2024-T3 by scanning kelvin probe force microscopy and in situ atomic force microscopy scratching, Journal of The Electrochemical Society, 145, (1998)
  • [9] Garcia R., Perez R., Dynamic atomic force microscopy methods, Surface Science Reports, 47, (2002)
  • [10] Holscher H., Ebeling D., Schmutz J.E., Et al., Dynamic force microscopy and spectroscopy using the frequency-modulation technique in air and liquids, Scanning Probe Microscopy in Nanoscience and Nanotechnology, (2010)
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